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Title: High resolution x-ray and gamma ray imaging using diffraction lenses with mechanically bent crystals

Abstract

A method for high spatial resolution imaging of a plurality of sources of x-ray and gamma-ray radiation is provided. High quality mechanically bent diffracting crystals of 0.1 mm radial width are used for focusing the radiation and directing the radiation to an array of detectors which is used for analyzing their addition to collect data as to the location of the source of radiation. A computer is used for converting the data to an image. The invention also provides for the use of a multi-component high resolution detector array and for narrow source and detector apertures.

Inventors:
 [1]
  1. Hinsdale, IL
Issue Date:
Research Org.:
Argonne National Lab. (ANL), Argonne, IL (United States)
Sponsoring Org.:
USDOE
OSTI Identifier:
985695
Patent Number(s):
7468516
Application Number:
11/479,797
Assignee:
UChicago Argonne, LLC (Chicago, IL)
Patent Classifications (CPCs):
G - PHYSICS G01 - MEASURING G01N - INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
DOE Contract Number:  
W-31-109-ENG-38
Resource Type:
Patent
Country of Publication:
United States
Language:
English
Subject:
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY

Citation Formats

Smither, Robert K. High resolution x-ray and gamma ray imaging using diffraction lenses with mechanically bent crystals. United States: N. p., 2008. Web.
Smither, Robert K. High resolution x-ray and gamma ray imaging using diffraction lenses with mechanically bent crystals. United States.
Smither, Robert K. Tue . "High resolution x-ray and gamma ray imaging using diffraction lenses with mechanically bent crystals". United States. https://www.osti.gov/servlets/purl/985695.
@article{osti_985695,
title = {High resolution x-ray and gamma ray imaging using diffraction lenses with mechanically bent crystals},
author = {Smither, Robert K},
abstractNote = {A method for high spatial resolution imaging of a plurality of sources of x-ray and gamma-ray radiation is provided. High quality mechanically bent diffracting crystals of 0.1 mm radial width are used for focusing the radiation and directing the radiation to an array of detectors which is used for analyzing their addition to collect data as to the location of the source of radiation. A computer is used for converting the data to an image. The invention also provides for the use of a multi-component high resolution detector array and for narrow source and detector apertures.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {2008},
month = {12}
}

Patent:

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