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Title: Ultra-short wavelength x-ray system

Abstract

A method and apparatus to generate a beam of coherent light including x-rays or XUV by colliding a high-intensity laser pulse with an electron beam that is accelerated by a synchronized laser pulse. Applications include x-ray and EUV lithography, protein structural analysis, plasma diagnostics, x-ray diffraction, crack analysis, non-destructive testing, surface science and ultrafast science.

Inventors:
 [1];  [1];  [2]
  1. Ann Arbor, MI
  2. Potomac, MD
Issue Date:
Research Org.:
University of Michigan (Ann Arbor, MI)
Sponsoring Org.:
USDOE
OSTI Identifier:
983774
Patent Number(s):
7321604
Application Number:
10/753,604
Assignee:
The Regents of the University of Michigan (Ann Arbor, MI)
Patent Classifications (CPCs):
H - ELECTRICITY H01 - BASIC ELECTRIC ELEMENTS H01S - DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT
A - HUMAN NECESSITIES A61 - MEDICAL OR VETERINARY SCIENCE A61N - ELECTROTHERAPY
DOE Contract Number:  
FG02-96ER14685
Resource Type:
Patent
Country of Publication:
United States
Language:
English
Subject:
47 OTHER INSTRUMENTATION

Citation Formats

Umstadter, Donald, He, Fei, and Lau, Yue-Ying. Ultra-short wavelength x-ray system. United States: N. p., 2008. Web.
Umstadter, Donald, He, Fei, & Lau, Yue-Ying. Ultra-short wavelength x-ray system. United States.
Umstadter, Donald, He, Fei, and Lau, Yue-Ying. Tue . "Ultra-short wavelength x-ray system". United States. https://www.osti.gov/servlets/purl/983774.
@article{osti_983774,
title = {Ultra-short wavelength x-ray system},
author = {Umstadter, Donald and He, Fei and Lau, Yue-Ying},
abstractNote = {A method and apparatus to generate a beam of coherent light including x-rays or XUV by colliding a high-intensity laser pulse with an electron beam that is accelerated by a synchronized laser pulse. Applications include x-ray and EUV lithography, protein structural analysis, plasma diagnostics, x-ray diffraction, crack analysis, non-destructive testing, surface science and ultrafast science.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {2008},
month = {1}
}

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