Recording multiple spatially-heterodyned direct to digital holograms in one digital image
Abstract
Systems and methods are described for recording multiple spatially-heterodyned direct to digital holograms in one digital image. A method includes digitally recording, at a first reference beam-object beam angle, a first spatially-heterodyned hologram including spatial heterodyne fringes for Fourier analysis; Fourier analyzing the recorded first spatially-heterodyned hologram by shifting a first original origin of the recorded first spatially-heterodyned hologram to sit on top of a first spatial-heterodyne carrier frequency defined by the first reference beam-object beam angle; digitally recording, at a second reference beam-object beam angle, a second spatially-heterodyned hologram including spatial heterodyne fringes for Fourier analysis; Fourier analyzing the recorded second spatially-heterodyned hologram by shifting a second original origin of the recorded second spatially-heterodyned hologram to sit on top of a second spatial-heterodyne carrier frequency defined by the second reference beam-object beam angle; applying a first digital filter to cut off signals around the first original origin and define a first result; performing a first inverse Fourier transform on the first result; applying a second digital filter to cut off signals around the second original origin and define a second result; and performing a second inverse Fourier transform on the second result, wherein the first reference beam-object beam anglemore »
- Inventors:
-
- Clinton, TN
- Knoxville, TN
- Issue Date:
- Research Org.:
- Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)
- Sponsoring Org.:
- USDOE
- OSTI Identifier:
- 969777
- Patent Number(s):
- 7349100
- Application Number:
- 10/607,824
- Assignee:
- UT-Battelle LLC (Oak Ridge, TN)
- Patent Classifications (CPCs):
-
G - PHYSICS G03 - PHOTOGRAPHY G03H - HOLOGRAPHIC PROCESSES OR APPARATUS
- DOE Contract Number:
- AC05-00OR22725
- Resource Type:
- Patent
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 97 MATHEMATICS AND COMPUTING
Citation Formats
Hanson, Gregory R, and Bingham, Philip R. Recording multiple spatially-heterodyned direct to digital holograms in one digital image. United States: N. p., 2008.
Web.
Hanson, Gregory R, & Bingham, Philip R. Recording multiple spatially-heterodyned direct to digital holograms in one digital image. United States.
Hanson, Gregory R, and Bingham, Philip R. Tue .
"Recording multiple spatially-heterodyned direct to digital holograms in one digital image". United States. https://www.osti.gov/servlets/purl/969777.
@article{osti_969777,
title = {Recording multiple spatially-heterodyned direct to digital holograms in one digital image},
author = {Hanson, Gregory R and Bingham, Philip R},
abstractNote = {Systems and methods are described for recording multiple spatially-heterodyned direct to digital holograms in one digital image. A method includes digitally recording, at a first reference beam-object beam angle, a first spatially-heterodyned hologram including spatial heterodyne fringes for Fourier analysis; Fourier analyzing the recorded first spatially-heterodyned hologram by shifting a first original origin of the recorded first spatially-heterodyned hologram to sit on top of a first spatial-heterodyne carrier frequency defined by the first reference beam-object beam angle; digitally recording, at a second reference beam-object beam angle, a second spatially-heterodyned hologram including spatial heterodyne fringes for Fourier analysis; Fourier analyzing the recorded second spatially-heterodyned hologram by shifting a second original origin of the recorded second spatially-heterodyned hologram to sit on top of a second spatial-heterodyne carrier frequency defined by the second reference beam-object beam angle; applying a first digital filter to cut off signals around the first original origin and define a first result; performing a first inverse Fourier transform on the first result; applying a second digital filter to cut off signals around the second original origin and define a second result; and performing a second inverse Fourier transform on the second result, wherein the first reference beam-object beam angle is not equal to the second reference beam-object beam angle and a single digital image includes both the first spatially-heterodyned hologram and the second spatially-heterodyned hologram.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {Tue Mar 25 00:00:00 EDT 2008},
month = {Tue Mar 25 00:00:00 EDT 2008}
}
Works referenced in this record:
Pulsed digital holographic interferometry with 694- and 347-nm wavelengths
journal, January 2000
- Pedrini, Giancarlo; Tiziani, Hans J.; Gusev, Mikhail E.
- Applied Optics, Vol. 39, Issue 2
Quantitative evaluation of two-dimensional dynamic deformations using digital holography
journal, July 1997
- Pedrini, G.; Tiziani, H. J.
- Optics & Laser Technology, Vol. 29, Issue 5
Advanced electron holography: a new algorithm for image processing and a standardized quality test for the FEG electron microscope
journal, April 1995
- Völkl, E.; Allard, L. F.; Datye, A.
- Ultramicroscopy, Vol. 58, Issue 1
Multipulsed digital holography applied to full 3D measurements of dynamic events
conference, September 2001
- Mendoza Santoyo, Fernando; Pedrini, Giancarlo; Schedin, Staffan
- Laser Metrology for Precision Management and Inspection in Industry, SPIE Proceedings
Direct To Digital Holography For High Aspect Ratio Inspection of Semiconductor Wafers
conference, January 2003
- Thomas, C. E. (Tommy)
- CHARACTERIZATION AND METROLOGY FOR ULSI TECHNOLOGY: 2003 International Conference on Characterization and Metrology for ULSI Technology, AIP Conference Proceedings
A software package for the processing and reconstruction of electron holograms
journal, October 1995
- VÖLkl, E.; Allard, L. F.; Frost, B.
- Journal of Microscopy, Vol. 180, Issue 1
Direct to digital holography for semiconductor wafer defect detection and review
conference, July 2002
- Thomas, Jr., C. E.; Bahm, Tracy M.; Baylor, Larry R.
- Design, Process Integration, and Characterization for Microelectronics, SPIE Proceedings
Wavefront Reconstruction with Diffused Illumination and Three-Dimensional Objects*
journal, January 1964
- Leith, Emmett N.; Upatnieks, Juris
- Journal of the Optical Society of America, Vol. 54, Issue 11
Fracional–Fringe Holographic Plasma Interferometry
journal, January 1967
- Jahoda, F. C.; Jeffries, R. A.; Sawyer, G. A.
- Applied Optics, Vol. 6, Issue 8
Reconstructed Wavefronts and Communication Theory*
journal, January 1962
- Leith, Emmett N.; Upatnieks, Juris
- Journal of the Optical Society of America, Vol. 52, Issue 10
Holographic Interferometry
journal, February 1966
- Heflinger, L. O.; Wuerker, R. F.; Brooks, R. E.
- Journal of Applied Physics, Vol. 37, Issue 2
High-resolution photomask transmission and phase measurement tool
conference, July 2002
- Jacob, Jim J.; Litvin, Tim; Merriam, Andrew J.
- SPIE's 27th Annual International Symposium on Microlithography, SPIE Proceedings
Wavefront Reconstruction with Continuous-Tone Objects*
journal, January 1963
- Leith, Emmett N.; Upatnieks, Juris
- Journal of the Optical Society of America, Vol. 53, Issue 12
Holographic Interferometry
book, January 1994
- Rastogi, Pramod K.
- Springer Series in Optical Sciences
The extended Fourier algorithm: Application in discrete optics and electron holography
journal, January 1994
- Voelkl, E.; Allard, L. F.
- Proceedings, annual meeting, Electron Microscopy Society of America, Vol. 52
Direct sampling and demodulation of carrier-frequency signals
journal, October 2002
- Khare, Kedar; George, Nicholas
- Optics Communications, Vol. 211, Issue 1-6
Holographic interferometric microscope for complete displacement determination
journal, September 1997
- Kruschke, Oliver
- Optical Engineering, Vol. 36, Issue 9