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Title: Method for the depth corrected detection of ionizing events from a co-planar grids sensor

Abstract

A method for the detection of ionizing events utilizing a co-planar grids sensor comprising a semiconductor substrate, cathode electrode, collecting grid and non-collecting grid. The semiconductor substrate is sensitive to ionizing radiation. A voltage less than 0 Volts is applied to the cathode electrode. A voltage greater than the voltage applied to the cathode is applied to the non-collecting grid. A voltage greater than the voltage applied to the non-collecting grid is applied to the collecting grid. The collecting grid and the non-collecting grid are summed and subtracted creating a sum and difference respectively. The difference and sum are divided creating a ratio. A gain coefficient factor for each depth (distance between the ionizing event and the collecting grid) is determined, whereby the difference between the collecting electrode and the non-collecting electrode multiplied by the corresponding gain coefficient is the depth corrected energy of an ionizing event. Therefore, the energy of each ionizing event is the difference between the collecting grid and the non-collecting grid multiplied by the corresponding gain coefficient. The depth of the ionizing event can also be determined from the ratio.

Inventors:
 [1];  [2];  [3]
  1. Syosset, NY
  2. South Setauket, NY
  3. Port Jefferson, NY
Issue Date:
Research Org.:
Brookhaven National Lab. (BNL), Upton, NY (United States)
Sponsoring Org.:
USDOE
OSTI Identifier:
963813
Patent Number(s):
7,531,808
Application Number:
11/626,919
Assignee:
The United States of America as represented by the U.S. Department of Energy (Washington, DC)
DOE Contract Number:  
AC02-98CH10886
Resource Type:
Patent
Country of Publication:
United States
Language:
English
Subject:
47 OTHER INSTRUMENTATION

Citation Formats

De Geronimo, Gianluigi, Bolotnikov, Aleksey E, and Carini, Gabriella. Method for the depth corrected detection of ionizing events from a co-planar grids sensor. United States: N. p., 2009. Web.
De Geronimo, Gianluigi, Bolotnikov, Aleksey E, & Carini, Gabriella. Method for the depth corrected detection of ionizing events from a co-planar grids sensor. United States.
De Geronimo, Gianluigi, Bolotnikov, Aleksey E, and Carini, Gabriella. Tue . "Method for the depth corrected detection of ionizing events from a co-planar grids sensor". United States. https://www.osti.gov/servlets/purl/963813.
@article{osti_963813,
title = {Method for the depth corrected detection of ionizing events from a co-planar grids sensor},
author = {De Geronimo, Gianluigi and Bolotnikov, Aleksey E and Carini, Gabriella},
abstractNote = {A method for the detection of ionizing events utilizing a co-planar grids sensor comprising a semiconductor substrate, cathode electrode, collecting grid and non-collecting grid. The semiconductor substrate is sensitive to ionizing radiation. A voltage less than 0 Volts is applied to the cathode electrode. A voltage greater than the voltage applied to the cathode is applied to the non-collecting grid. A voltage greater than the voltage applied to the non-collecting grid is applied to the collecting grid. The collecting grid and the non-collecting grid are summed and subtracted creating a sum and difference respectively. The difference and sum are divided creating a ratio. A gain coefficient factor for each depth (distance between the ionizing event and the collecting grid) is determined, whereby the difference between the collecting electrode and the non-collecting electrode multiplied by the corresponding gain coefficient is the depth corrected energy of an ionizing event. Therefore, the energy of each ionizing event is the difference between the collecting grid and the non-collecting grid multiplied by the corresponding gain coefficient. The depth of the ionizing event can also be determined from the ratio.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {2009},
month = {5}
}

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