Data processing device test apparatus and method therefor
Abstract
A method and apparatus mechanism for testing data processing devices are implemented. The test mechanism isolates critical paths by correlating a scanning microscope image with a selected speed path failure. A trigger signal having a preselected value is generated at the start of each pattern vector. The sweep of the scanning microscope is controlled by a computer, which also receives and processes the image signals returned from the microscope. The value of the trigger signal is correlated with a set of pattern lines being driven on the DUT. The trigger is either asserted or negated depending the detection of a pattern line failure and the particular line that failed. In response to the detection of the particular speed path failure being characterized, and the trigger signal, the control computer overlays a mask on the image of the device under test (DUT). The overlaid image provides a visual correlation of the failure with the structural elements of the DUT at the level of resolution of the microscope itself.
- Inventors:
-
- Austin, TX
- (New Bernalillo, NM)
- Bernalillo, NM
- Santa Clara, CA
- Issue Date:
- Research Org.:
- Sandia National Laboratories (SNL), Albuquerque, NM, and Livermore, CA (United States)
- Sponsoring Org.:
- USDOE
- OSTI Identifier:
- 921440
- Patent Number(s):
- 6546513
- Application Number:
- 09/586,572
- Assignee:
- Advanced Micro Devices (Austin, TX)
- Patent Classifications (CPCs):
-
G - PHYSICS G01 - MEASURING G01R - MEASURING ELECTRIC VARIABLES
G - PHYSICS G06 - COMPUTING G06F - ELECTRIC DIGITAL DATA PROCESSING
- DOE Contract Number:
- AC04-94AL85000
- Resource Type:
- Patent
- Country of Publication:
- United States
- Language:
- English
Citation Formats
Wilcox, Richard Jacob, Mulig, Jason D, Eppes, David, Bruce, Michael R, Bruce, Victoria J, Ring, Rosalinda M, Cole, Jr., Edward I., Tangyunyong, Paiboon, Hawkins, Charles F, and Louie, Arnold Y. Data processing device test apparatus and method therefor. United States: N. p., 2003.
Web.
Wilcox, Richard Jacob, Mulig, Jason D, Eppes, David, Bruce, Michael R, Bruce, Victoria J, Ring, Rosalinda M, Cole, Jr., Edward I., Tangyunyong, Paiboon, Hawkins, Charles F, & Louie, Arnold Y. Data processing device test apparatus and method therefor. United States.
Wilcox, Richard Jacob, Mulig, Jason D, Eppes, David, Bruce, Michael R, Bruce, Victoria J, Ring, Rosalinda M, Cole, Jr., Edward I., Tangyunyong, Paiboon, Hawkins, Charles F, and Louie, Arnold Y. Tue .
"Data processing device test apparatus and method therefor". United States. https://www.osti.gov/servlets/purl/921440.
@article{osti_921440,
title = {Data processing device test apparatus and method therefor},
author = {Wilcox, Richard Jacob and Mulig, Jason D and Eppes, David and Bruce, Michael R and Bruce, Victoria J and Ring, Rosalinda M and Cole, Jr., Edward I. and Tangyunyong, Paiboon and Hawkins, Charles F and Louie, Arnold Y},
abstractNote = {A method and apparatus mechanism for testing data processing devices are implemented. The test mechanism isolates critical paths by correlating a scanning microscope image with a selected speed path failure. A trigger signal having a preselected value is generated at the start of each pattern vector. The sweep of the scanning microscope is controlled by a computer, which also receives and processes the image signals returned from the microscope. The value of the trigger signal is correlated with a set of pattern lines being driven on the DUT. The trigger is either asserted or negated depending the detection of a pattern line failure and the particular line that failed. In response to the detection of the particular speed path failure being characterized, and the trigger signal, the control computer overlays a mask on the image of the device under test (DUT). The overlaid image provides a visual correlation of the failure with the structural elements of the DUT at the level of resolution of the microscope itself.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {Tue Apr 08 00:00:00 EDT 2003},
month = {Tue Apr 08 00:00:00 EDT 2003}
}