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Title: Data processing device test apparatus and method therefor

Abstract

A method and apparatus mechanism for testing data processing devices are implemented. The test mechanism isolates critical paths by correlating a scanning microscope image with a selected speed path failure. A trigger signal having a preselected value is generated at the start of each pattern vector. The sweep of the scanning microscope is controlled by a computer, which also receives and processes the image signals returned from the microscope. The value of the trigger signal is correlated with a set of pattern lines being driven on the DUT. The trigger is either asserted or negated depending the detection of a pattern line failure and the particular line that failed. In response to the detection of the particular speed path failure being characterized, and the trigger signal, the control computer overlays a mask on the image of the device under test (DUT). The overlaid image provides a visual correlation of the failure with the structural elements of the DUT at the level of resolution of the microscope itself.

Inventors:
 [1];  [1];  [1];  [1];  [1];  [1];  [2];  [3];  [3];  [4]
  1. (Austin, TX)
  2. (New Bernalillo, NM)
  3. (Bernalillo, NM)
  4. (Santa Clara, CA)
Issue Date:
Research Org.:
Sandia Corporation
Sponsoring Org.:
USDOE
OSTI Identifier:
921440
Patent Number(s):
6,546,513
Application Number:
09/586,572
Assignee:
Advanced Micro Devices (Austin, TX) ALO
DOE Contract Number:  
AC04-94AL85000
Resource Type:
Patent
Country of Publication:
United States
Language:
English

Citation Formats

Wilcox, Richard Jacob, Mulig, Jason D., Eppes, David, Bruce, Michael R., Bruce, Victoria J., Ring, Rosalinda M., Cole, Jr., Edward I., Tangyunyong, Paiboon, Hawkins, Charles F., and Louie, Arnold Y. Data processing device test apparatus and method therefor. United States: N. p., 2003. Web.
Wilcox, Richard Jacob, Mulig, Jason D., Eppes, David, Bruce, Michael R., Bruce, Victoria J., Ring, Rosalinda M., Cole, Jr., Edward I., Tangyunyong, Paiboon, Hawkins, Charles F., & Louie, Arnold Y. Data processing device test apparatus and method therefor. United States.
Wilcox, Richard Jacob, Mulig, Jason D., Eppes, David, Bruce, Michael R., Bruce, Victoria J., Ring, Rosalinda M., Cole, Jr., Edward I., Tangyunyong, Paiboon, Hawkins, Charles F., and Louie, Arnold Y. Tue . "Data processing device test apparatus and method therefor". United States. https://www.osti.gov/servlets/purl/921440.
@article{osti_921440,
title = {Data processing device test apparatus and method therefor},
author = {Wilcox, Richard Jacob and Mulig, Jason D. and Eppes, David and Bruce, Michael R. and Bruce, Victoria J. and Ring, Rosalinda M. and Cole, Jr., Edward I. and Tangyunyong, Paiboon and Hawkins, Charles F. and Louie, Arnold Y.},
abstractNote = {A method and apparatus mechanism for testing data processing devices are implemented. The test mechanism isolates critical paths by correlating a scanning microscope image with a selected speed path failure. A trigger signal having a preselected value is generated at the start of each pattern vector. The sweep of the scanning microscope is controlled by a computer, which also receives and processes the image signals returned from the microscope. The value of the trigger signal is correlated with a set of pattern lines being driven on the DUT. The trigger is either asserted or negated depending the detection of a pattern line failure and the particular line that failed. In response to the detection of the particular speed path failure being characterized, and the trigger signal, the control computer overlays a mask on the image of the device under test (DUT). The overlaid image provides a visual correlation of the failure with the structural elements of the DUT at the level of resolution of the microscope itself.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {2003},
month = {4}
}

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