Spin microscope based on optically detected magnetic resonance

Berman, Gennady P.; Chernobrod, Boris M.

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Title: Spin microscope based on optically detected magnetic resonance

Abstract

The invention relates to scanning magnetic microscope which has a photoluminescent nanoprobe implanted in the tip apex of an atomic force microscope (AFM), a scanning tunneling microscope (STM) or a near-field scanning optical microscope (NSOM) and exhibits optically detected magnetic resonance (ODMR) in the vicinity of unpaired electron spins or nuclear magnetic moments in the sample material. The described spin microscope has demonstrated nanoscale lateral resolution and single spin sensitivity for the AFM and STM embodiments.

Inventors:: Berman, Gennady P.; Chernobrod, Boris M.

Issue Date:: 2007-12-11

Research Org.:: Los Alamos National Laboratory (LANL), Los Alamos, NM (United States)

Sponsoring Org.:: USDOE

OSTI Identifier:: 921033

Patent Number(s):: 7305869

Application Number:: 11/102,626

Assignee:: United States Department of Energy U. S. Department of Energy (Washington, DC)

Patent Classifications (CPCs):: B - PERFORMING OPERATIONS B82 - NANOTECHNOLOGY B82Y - SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES

G - PHYSICS G01 - MEASURING G01Q - SCANNING-PROBE TECHNIQUES OR APPARATUS

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B - PERFORMING OPERATIONS B82 - NANOTECHNOLOGY B82Y - SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES
B82Y15/00 - Nanotechnology for interacting, sensing or actuating, e.g. quantum dots as markers in protein assays or molecular motors
B82Y25/00 - Nanomagnetism, e.g. magnetoimpedance, anisotropic magnetoresistance, giant magnetoresistance or tunneling magnetoresistance
B82Y35/00 - Methods or apparatus for measurement or analysis of nanostructures

G - PHYSICS G01 - MEASURING G01Q - SCANNING-PROBE TECHNIQUES OR APPARATUS
G01Q30/02 - Non-SPM analysing devices, e.g. SEM [Scanning Electron Microscope], spectrometer or optical microscope
G01Q60/02 - Multiple-type SPM, i.e. involving more than one SPM techniques
G01Q60/52 - Resonance
G01Q70/18 - Functionalisation

G - PHYSICS G01 - MEASURING G01R - MEASURING ELECTRIC VARIABLES
G01R33/0385 - {in relation with magnetic force measurements
G01R33/10 - Plotting field distribution {

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DOE Contract Number:: W-7405-ENG-36

Resource Type:: Patent

Resource Relation:: Patent File Date: 2005 Apr 11

Country of Publication:: United States

Language:: English

Citation Formats


                    Berman, Gennady P., and Chernobrod, Boris M. Spin microscope based on optically detected magnetic resonance.  United States: N. p., 2007. 
        Web.

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                    Berman, Gennady P., & Chernobrod, Boris M. Spin microscope based on optically detected magnetic resonance.  United States.

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                    Berman, Gennady P., and Chernobrod, Boris M. Tue .  
        "Spin microscope based on optically detected magnetic resonance".  United States.  https://www.osti.gov/servlets/purl/921033.

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@article{osti_921033,

  title        = {Spin microscope based on optically detected magnetic resonance},

  author       = {Berman, Gennady P. and Chernobrod, Boris M.},

  abstractNote = {The invention relates to scanning magnetic microscope which has a photoluminescent nanoprobe implanted in the tip apex of an atomic force microscope (AFM), a scanning tunneling microscope (STM) or a near-field scanning optical microscope (NSOM) and exhibits optically detected magnetic resonance (ODMR) in the vicinity of unpaired electron spins or nuclear magnetic moments in the sample material. The described spin microscope has demonstrated nanoscale lateral resolution and single spin sensitivity for the AFM and STM embodiments.},

  doi          = {},

  journal      = {},
number       = ,

  volume       = ,

  place        = {United States},

  year         = {2007},

  month        = {12}

}

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Works referenced in this record:

Local fluorescent probes for the fluorescence resonance energy transfer scanning near-field optical microscopy
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Shubeita, G. T.; Sekatskii, S. K.; Dietler, G.
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Applied Physics Letters, Vol. 80, Issue 5
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Hidden symmetries in the energy levels of excitonic ‘artificial atoms’
journal, June 2000

Bayer, M.; Stern, O.; Hawrylak, P.
Nature, Vol. 405, Issue 6789
https://doi.org/10.1038/35016020