skip to main content
DOE Patents title logo U.S. Department of Energy
Office of Scientific and Technical Information

Title: Spin microscope based on optically detected magnetic resonance

Abstract

The invention relates to scanning magnetic microscope which has a photoluminescent nanoprobe implanted in the tip apex of an atomic force microscope (AFM), a scanning tunneling microscope (STM) or a near-field scanning optical microscope (NSOM) and exhibits optically detected magnetic resonance (ODMR) in the vicinity of unpaired electron spins or nuclear magnetic moments in the sample material. The described spin microscope has demonstrated nanoscale lateral resolution and single spin sensitivity for the AFM and STM embodiments.

Inventors:
;
Issue Date:
Research Org.:
Los Alamos National Lab. (LANL), Los Alamos, NM (United States)
Sponsoring Org.:
USDOE
OSTI Identifier:
921033
Patent Number(s):
7305869
Application Number:
11/102,626
Assignee:
United States Department of Energy U. S. Department of Energy (Washington, DC)
Patent Classifications (CPCs):
G - PHYSICS G01 - MEASURING G01R - MEASURING ELECTRIC VARIABLES
G - PHYSICS G01 - MEASURING G01Q - SCANNING-PROBE TECHNIQUES OR APPARATUS
DOE Contract Number:  
W-7405-ENG-36
Resource Type:
Patent
Resource Relation:
Patent File Date: 2005 Apr 11
Country of Publication:
United States
Language:
English

Citation Formats

Berman, Gennady P., and Chernobrod, Boris M. Spin microscope based on optically detected magnetic resonance. United States: N. p., 2007. Web.
Berman, Gennady P., & Chernobrod, Boris M. Spin microscope based on optically detected magnetic resonance. United States.
Berman, Gennady P., and Chernobrod, Boris M. Tue . "Spin microscope based on optically detected magnetic resonance". United States. https://www.osti.gov/servlets/purl/921033.
@article{osti_921033,
title = {Spin microscope based on optically detected magnetic resonance},
author = {Berman, Gennady P. and Chernobrod, Boris M.},
abstractNote = {The invention relates to scanning magnetic microscope which has a photoluminescent nanoprobe implanted in the tip apex of an atomic force microscope (AFM), a scanning tunneling microscope (STM) or a near-field scanning optical microscope (NSOM) and exhibits optically detected magnetic resonance (ODMR) in the vicinity of unpaired electron spins or nuclear magnetic moments in the sample material. The described spin microscope has demonstrated nanoscale lateral resolution and single spin sensitivity for the AFM and STM embodiments.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {2007},
month = {12}
}

Patent:

Save / Share:

Works referenced in this record:

Local fluorescent probes for the fluorescence resonance energy transfer scanning near-field optical microscopy
journal, April 2002


Observation of a magic discrete family of ultrabright Si nanoparticles
journal, February 2002


Hidden symmetries in the energy levels of excitonic ‘artificial atoms’
journal, June 2000


Spin microscope based on optically detected magnetic resonance
journal, January 2005


Optical detection of magnetic resonance in a single molecule
journal, May 1993


Nanometer-resolution scanning optical microscope with resonance excitation of the fluorescence of the samples from a single-atom excited center
journal, March 1996


Optically Detected Magnetic Resonance Study of Electron/Hole Traps on CdSe Quantum Dot Surfaces
journal, November 1998


Enhanced sensitivity near-field scanning optical microscopy at high spatial resolution
journal, September 1998


Mechanical detection of magnetic resonance
journal, December 1992


Magnetic resonance of a single molecular spin
journal, May 1993


Getting high-efficiency photoluminescence from Si nanocrystals in SiO2 matrix
journal, November 2002