Automated position control of a surface array relative to a liquid microjunction surface sampler
Abstract
A system and method utilizes an image analysis approach for controlling the probe-to-surface distance of a liquid junction-based surface sampling system for use with mass spectrometric detection. Such an approach enables a hands-free formation of the liquid microjunction used to sample solution composition from the surface and for re-optimization, as necessary, of the microjunction thickness during a surface scan to achieve a fully automated surface sampling system.
- Inventors:
-
- Clinton, TN
- Knoxville, TN
- Little Rock, AR
- Issue Date:
- Research Org.:
- Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)
- Sponsoring Org.:
- USDOE
- OSTI Identifier:
- 919880
- Patent Number(s):
- 7295026
- Application Number:
- 11/144,882
- Assignee:
- UT-Battelle, LLC (Oak Ridge, TN)
- Patent Classifications (CPCs):
-
H - ELECTRICITY H01 - BASIC ELECTRIC ELEMENTS H01J - ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- DOE Contract Number:
- AC05-00OR22725
- Resource Type:
- Patent
- Country of Publication:
- United States
- Language:
- English
Citation Formats
Van Berkel, Gary J, Kertesz, Vilmos, and Ford, Michael James. Automated position control of a surface array relative to a liquid microjunction surface sampler. United States: N. p., 2007.
Web.
Van Berkel, Gary J, Kertesz, Vilmos, & Ford, Michael James. Automated position control of a surface array relative to a liquid microjunction surface sampler. United States.
Van Berkel, Gary J, Kertesz, Vilmos, and Ford, Michael James. Tue .
"Automated position control of a surface array relative to a liquid microjunction surface sampler". United States. https://www.osti.gov/servlets/purl/919880.
@article{osti_919880,
title = {Automated position control of a surface array relative to a liquid microjunction surface sampler},
author = {Van Berkel, Gary J and Kertesz, Vilmos and Ford, Michael James},
abstractNote = {A system and method utilizes an image analysis approach for controlling the probe-to-surface distance of a liquid junction-based surface sampling system for use with mass spectrometric detection. Such an approach enables a hands-free formation of the liquid microjunction used to sample solution composition from the surface and for re-optimization, as necessary, of the microjunction thickness during a surface scan to achieve a fully automated surface sampling system.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {Tue Nov 13 00:00:00 EST 2007},
month = {Tue Nov 13 00:00:00 EST 2007}
}
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