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Title: Diagnostic system for profiling micro-beams

Abstract

An apparatus for characterization of a micro beam comprising a micro modified Faraday cup assembly including a first layer of material, a second layer of material operatively connected to the first layer of material, a third layer of material operatively connected to the second layer of material, and a fourth layer of material operatively connected to the third layer of material. The first layer of material comprises an electrical conducting material and has at least one first layer radial slit extending through the first layer. An electrical ground is connected to the first layer. The second layer of material comprises an insulating material and has at least one second layer radial slit corresponding to the first layer radial slit in the first layer of material. The second layer radial slit extends through the second layer. The third layer of material comprises a conducting material and has at least one third layer radial slit corresponding to the second layer radial slit in the second layer of material. The third layer radial slit extends through the third layer. The fourth layer of material comprises an electrical conducting material but does not have slits. An electrical measuring device is connected to the fourthmore » layer. The micro modified Faraday cup assembly is positioned to be swept by the micro beam.« less

Inventors:
 [1];  [2];  [2];  [3]
  1. Danville, CA
  2. Livermore, CA
  3. Berkeley, CA
Issue Date:
Research Org.:
Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States)
Sponsoring Org.:
USDOE
OSTI Identifier:
918905
Patent Number(s):
7288772
Application Number:
11/116,697
Assignee:
The Regents of the University of California (Oakland, CA)
Patent Classifications (CPCs):
H - ELECTRICITY H01 - BASIC ELECTRIC ELEMENTS H01J - ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
DOE Contract Number:  
W-7405-ENG-48
Resource Type:
Patent
Country of Publication:
United States
Language:
English
Subject:
47 OTHER INSTRUMENTATION

Citation Formats

Elmer, John W, Palmer, Todd A, Teruya, Alan T, and Walton, Chris C. Diagnostic system for profiling micro-beams. United States: N. p., 2007. Web.
Elmer, John W, Palmer, Todd A, Teruya, Alan T, & Walton, Chris C. Diagnostic system for profiling micro-beams. United States.
Elmer, John W, Palmer, Todd A, Teruya, Alan T, and Walton, Chris C. Tue . "Diagnostic system for profiling micro-beams". United States. https://www.osti.gov/servlets/purl/918905.
@article{osti_918905,
title = {Diagnostic system for profiling micro-beams},
author = {Elmer, John W and Palmer, Todd A and Teruya, Alan T and Walton, Chris C},
abstractNote = {An apparatus for characterization of a micro beam comprising a micro modified Faraday cup assembly including a first layer of material, a second layer of material operatively connected to the first layer of material, a third layer of material operatively connected to the second layer of material, and a fourth layer of material operatively connected to the third layer of material. The first layer of material comprises an electrical conducting material and has at least one first layer radial slit extending through the first layer. An electrical ground is connected to the first layer. The second layer of material comprises an insulating material and has at least one second layer radial slit corresponding to the first layer radial slit in the first layer of material. The second layer radial slit extends through the second layer. The third layer of material comprises a conducting material and has at least one third layer radial slit corresponding to the second layer radial slit in the second layer of material. The third layer radial slit extends through the third layer. The fourth layer of material comprises an electrical conducting material but does not have slits. An electrical measuring device is connected to the fourth layer. The micro modified Faraday cup assembly is positioned to be swept by the micro beam.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {2007},
month = {10}
}

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Works referenced in this record:

Fast method for measuring power density distribution of non-circular and irregular electron beams
journal, April 1998