High-voltage compatible, full-depleted CCD
Abstract
A charge coupled device for detecting electromagnetic and particle radiation is described. The device includes a high-resistivity semiconductor substrate, buried channel regions, gate electrode circuitry, and amplifier circuitry. For good spatial resolution and high performance, especially when operated at high voltages with full or nearly full depletion of the substrate, the device can also include a guard ring positioned near channel regions, a biased channel stop, and a biased polysilicon electrode over the channel stop.
- Inventors:
-
- Hercules, CA
- Issue Date:
- Research Org.:
- Lawrence Berkeley National Laboratory (LBNL), Berkeley, CA (United States)
- Sponsoring Org.:
- USDOE
- OSTI Identifier:
- 915229
- Patent Number(s):
- 7271468
- Application Number:
- 11/357,769
- Assignee:
- The Regents of the University of California (Oakland, CA)
- Patent Classifications (CPCs):
-
H - ELECTRICITY H01 - BASIC ELECTRIC ELEMENTS H01L - SEMICONDUCTOR DEVICES
- DOE Contract Number:
- AC03-76SF00098; AC02-05CH11231
- Resource Type:
- Patent
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 47 OTHER INSTRUMENTATION
Citation Formats
Holland, Stephen Edward. High-voltage compatible, full-depleted CCD. United States: N. p., 2007.
Web.
Holland, Stephen Edward. High-voltage compatible, full-depleted CCD. United States.
Holland, Stephen Edward. Tue .
"High-voltage compatible, full-depleted CCD". United States. https://www.osti.gov/servlets/purl/915229.
@article{osti_915229,
title = {High-voltage compatible, full-depleted CCD},
author = {Holland, Stephen Edward},
abstractNote = {A charge coupled device for detecting electromagnetic and particle radiation is described. The device includes a high-resistivity semiconductor substrate, buried channel regions, gate electrode circuitry, and amplifier circuitry. For good spatial resolution and high performance, especially when operated at high voltages with full or nearly full depletion of the substrate, the device can also include a guard ring positioned near channel regions, a biased channel stop, and a biased polysilicon electrode over the channel stop.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {Tue Sep 18 00:00:00 EDT 2007},
month = {Tue Sep 18 00:00:00 EDT 2007}
}
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