Micro-tensile testing system
Abstract
A micro-tensile testing system providing a stand-alone test platform for testing and reporting physical or engineering properties of test samples of materials having thicknesses of approximately between 0.002 inch and 0.030 inch, including, for example, LiGA engineered materials. The testing system is able to perform a variety of static, dynamic, and cyclic tests. The testing system includes a rigid frame and adjustable gripping supports to minimize measurement errors due to deflection or bending under load; serrated grips for securing the extremely small test sample; high-speed laser scan micrometers for obtaining accurate results; and test software for controlling the testing procedure and reporting results.
- Inventors:
-
- Lenexa, KS
- Issue Date:
- Research Org.:
- Kansas City Plant (KCP), Kansas City, MO (United States)
- Sponsoring Org.:
- USDOE
- OSTI Identifier:
- 913142
- Patent Number(s):
- 7243554
- Application Number:
- 11/229,111
- Assignee:
- Honeywell Federal Manufacturing & Technologies (Kansas City, MO)
- Patent Classifications (CPCs):
-
G - PHYSICS G01 - MEASURING G01N - INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- DOE Contract Number:
- AC04-01AL66850
- Resource Type:
- Patent
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 42 ENGINEERING
Citation Formats
Wenski, Edward G. Micro-tensile testing system. United States: N. p., 2007.
Web.
Wenski, Edward G. Micro-tensile testing system. United States.
Wenski, Edward G. Tue .
"Micro-tensile testing system". United States. https://www.osti.gov/servlets/purl/913142.
@article{osti_913142,
title = {Micro-tensile testing system},
author = {Wenski, Edward G},
abstractNote = {A micro-tensile testing system providing a stand-alone test platform for testing and reporting physical or engineering properties of test samples of materials having thicknesses of approximately between 0.002 inch and 0.030 inch, including, for example, LiGA engineered materials. The testing system is able to perform a variety of static, dynamic, and cyclic tests. The testing system includes a rigid frame and adjustable gripping supports to minimize measurement errors due to deflection or bending under load; serrated grips for securing the extremely small test sample; high-speed laser scan micrometers for obtaining accurate results; and test software for controlling the testing procedure and reporting results.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {2007},
month = {7}
}
Works referenced in this record:
Piezo-Actuated Microtensile Test Apparatus
journal, January 1998
- Petersen, Dr; Read, Dt
- Journal of Testing and Evaluation, Vol. 26, Issue 3
Tensile testing device for microstructured specimens
journal, December 1997
- Ilzhöfer, A.; Schneider, H.; Tsakmakis, C.
- Microsystem Technologies, Vol. 4, Issue 1