Trigger probe for determining the orientation of the power distribution of an electron beam
Abstract
The present invention relates to a probe for determining the orientation of electron beams being profiled. To accurately time the location of an electron beam, the probe is designed to accept electrons from only a narrowly defined area. The signal produced from the probe is then used as a timing or triggering fiducial for an operably coupled data acquisition system. Such an arrangement eliminates changes in slit geometry, an additional signal feedthrough in the wall of a welding chamber and a second timing or triggering channel on a data acquisition system. As a result, the present invention improves the accuracy of the resulting data by minimizing the adverse effects of current slit triggering methods so as to accurately reconstruct electron or ion beams.
- Inventors:
-
- Danville, CA
- Livermore, CA
- Issue Date:
- Research Org.:
- Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States)
- Sponsoring Org.:
- USDOE
- OSTI Identifier:
- 913137
- Patent Number(s):
- 7,244,950
- Application Number:
- 11/158,481
- Assignee:
- The Regents of the University of California (Oakland, CA)
- DOE Contract Number:
- W-7405-ENG-48
- Resource Type:
- Patent
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 47 OTHER INSTRUMENTATION
Citation Formats
Elmer, John W, Palmer, Todd A, and Teruya, Alan T. Trigger probe for determining the orientation of the power distribution of an electron beam. United States: N. p., 2007.
Web.
Elmer, John W, Palmer, Todd A, & Teruya, Alan T. Trigger probe for determining the orientation of the power distribution of an electron beam. United States.
Elmer, John W, Palmer, Todd A, and Teruya, Alan T. Tue .
"Trigger probe for determining the orientation of the power distribution of an electron beam". United States. https://www.osti.gov/servlets/purl/913137.
@article{osti_913137,
title = {Trigger probe for determining the orientation of the power distribution of an electron beam},
author = {Elmer, John W and Palmer, Todd A and Teruya, Alan T},
abstractNote = {The present invention relates to a probe for determining the orientation of electron beams being profiled. To accurately time the location of an electron beam, the probe is designed to accept electrons from only a narrowly defined area. The signal produced from the probe is then used as a timing or triggering fiducial for an operably coupled data acquisition system. Such an arrangement eliminates changes in slit geometry, an additional signal feedthrough in the wall of a welding chamber and a second timing or triggering channel on a data acquisition system. As a result, the present invention improves the accuracy of the resulting data by minimizing the adverse effects of current slit triggering methods so as to accurately reconstruct electron or ion beams.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {2007},
month = {7}
}