Method for non-referential defect characterization using fractal encoding and active contours

Gleason, Shaun S; Sari-Sarraf, Hamed

Title: Method for non-referential defect characterization using fractal encoding and active contours

Abstract

A method for identification of anomalous structures, such as defects, includes the steps of providing a digital image and applying fractal encoding to identify a location of at least one anomalous portion of the image. The method does not require a reference image to identify the location of the anomalous portion. The method can further include the step of initializing an active contour based on the location information obtained from the fractal encoding step and deforming an active contour to enhance the boundary delineation of the anomalous portion.

Inventors:

Gleason, Shaun S ^[1]; Sari-Sarraf, Hamed ^[2]

Knoxville, TN
Lubbock, TX

Issue Date:: 2007-05-15

Research Org.:: Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States)

Sponsoring Org.:: USDOE

OSTI Identifier:: 909404

Patent Number(s):: 7218772

Application Number:: 10/166,296

Assignee:: Ut-Battelle LLC (Oak Ridge, TN)

Patent Classifications (CPCs):: G - PHYSICS G06 - COMPUTING G06T - IMAGE DATA PROCESSING OR GENERATION, IN GENERAL

G - PHYSICS G06 - COMPUTING G06K - RECOGNITION OF DATA

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G - PHYSICS G06 - COMPUTING G06T - IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
G06T7/73 - using feature-based methods
G06T2207/10056 - Microscopic image
G06T7/149 - involving deformable models, e.g. active contour models
G06T7/0004 - {Industrial image inspection}
G06T7/12 - Edge-based segmentation

G - PHYSICS G06 - COMPUTING G06K - RECOGNITION OF DATA
G06K9/6207 - {based on a local optimisation criterion, e.g. "snakes", i.e. active contour models of the pattern to be recognised}

G - PHYSICS G06 - COMPUTING G06T - IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
G06T2207/30148 - Semiconductor

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DOE Contract Number:: AC05-00OR22725

Resource Type:: Patent

Country of Publication:: United States

Language:: English

Subject:: 47 OTHER INSTRUMENTATION

Citation Formats


                    Gleason, Shaun S, and Sari-Sarraf, Hamed. Method for non-referential defect characterization using fractal encoding and active contours.  United States: N. p., 2007. 
        Web.

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                    Gleason, Shaun S, & Sari-Sarraf, Hamed. Method for non-referential defect characterization using fractal encoding and active contours.  United States.

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                    Gleason, Shaun S, and Sari-Sarraf, Hamed. Tue .  
        "Method for non-referential defect characterization using fractal encoding and active contours".  United States.  https://www.osti.gov/servlets/purl/909404.

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@article{osti_909404,

  title        = {Method for non-referential defect characterization using fractal encoding and active contours},

  author       = {Gleason, Shaun S and Sari-Sarraf, Hamed},

  abstractNote = {A method for identification of anomalous structures, such as defects, includes the steps of providing a digital image and applying fractal encoding to identify a location of at least one anomalous portion of the image. The method does not require a reference image to identify the location of the anomalous portion. The method can further include the step of initializing an active contour based on the location information obtained from the fractal encoding step and deforming an active contour to enhance the boundary delineation of the anomalous portion.},

  doi          = {},

  journal      = {},
number       = ,

  volume       = ,

  place        = {United States},

  year         = {2007},

  month        = {5}

}

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Works referenced in this record:

Multiple same-sized block mapping for recursive fractal image coding
journal, February 2002

Wang, Hongxing
Optical Engineering, Vol. 41, Issue 2
https://doi.org/10.1117/1.1428741

Front-end data reduction in computer-aided diagnosis of mammograms: a pilot study
conference, May 1999

Sari-Sarraf, Hamed; Gleason, Shaun S.; Nishikawa, Robert M.
Medical Imaging '99, SPIE Proceedings
https://doi.org/10.1117/12.348556

Nonlinear filter derived from topological image features
conference, September 1990

Jatko, William B.; Hunt, Martin A.; Tobin, Jr., Kenneth W.
Orlando '90, 16-20 April, SPIE Proceedings
https://doi.org/10.1117/12.21217

Detection of semiconductor defects using a novel fractal encoding algorithm
conference, July 2002

Gleason, Shaun S.; Ferrell, Regina K.; Karnowski, Thomas P.
Design, Process Integration, and Characterization for Microelectronics, SPIE Proceedings
https://doi.org/10.1117/12.475642

Higher accuracy and throughput in computer-aided screening of mammographic microcalcifications
conference, January 1997

Gleason, S. S.; Sari-Sarraf, H.; Hudson, K. T.
1997 IEEE Nuclear Science Symposium Conference Record
https://doi.org/10.1109/NSSMIC.1997.670596

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Title: Method for non-referential defect characterization using fractal encoding and active contours

Abstract

Citation Formats

Multiple same-sized block mapping for recursive fractal image coding journal, February 2002

Front-end data reduction in computer-aided diagnosis of mammograms: a pilot study conference, May 1999

Nonlinear filter derived from topological image features conference, September 1990

Detection of semiconductor defects using a novel fractal encoding algorithm conference, July 2002

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Multiple same-sized block mapping for recursive fractal image coding
journal, February 2002

Front-end data reduction in computer-aided diagnosis of mammograms: a pilot study
conference, May 1999

Nonlinear filter derived from topological image features
conference, September 1990

Detection of semiconductor defects using a novel fractal encoding algorithm
conference, July 2002

Higher accuracy and throughput in computer-aided screening of mammographic microcalcifications
conference, January 1997