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Title: Photothermal imaging scanning microscopy

Abstract

Photothermal Imaging Scanning Microscopy produces a rapid, thermal-based, non-destructive characterization apparatus. Also, a photothermal characterization method of surface and subsurface features includes micron and nanoscale spatial resolution of meter-sized optical materials.

Inventors:
 [1];  [2];  [1];  [3];  [4]
  1. Pleasanton, CA
  2. Lathrop, CA
  3. Discovery Bay, CA
  4. Tracy, CA
Issue Date:
Research Org.:
Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States)
Sponsoring Org.:
USDOE
OSTI Identifier:
908346
Patent Number(s):
7075058
Application Number:
10/402,604
Assignee:
The United States of America as represented by the United States Department of Energy (Washington, DC)
Patent Classifications (CPCs):
G - PHYSICS G01 - MEASURING G01N - INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
DOE Contract Number:  
W-7405-ENG-48
Resource Type:
Patent
Country of Publication:
United States
Language:
English
Subject:
47 OTHER INSTRUMENTATION

Citation Formats

Chinn, Diane, Stolz, Christopher J, Wu, Zhouling, Huber, Robert, and Weinzapfel, Carolyn. Photothermal imaging scanning microscopy. United States: N. p., 2006. Web.
Chinn, Diane, Stolz, Christopher J, Wu, Zhouling, Huber, Robert, & Weinzapfel, Carolyn. Photothermal imaging scanning microscopy. United States.
Chinn, Diane, Stolz, Christopher J, Wu, Zhouling, Huber, Robert, and Weinzapfel, Carolyn. Tue . "Photothermal imaging scanning microscopy". United States. https://www.osti.gov/servlets/purl/908346.
@article{osti_908346,
title = {Photothermal imaging scanning microscopy},
author = {Chinn, Diane and Stolz, Christopher J and Wu, Zhouling and Huber, Robert and Weinzapfel, Carolyn},
abstractNote = {Photothermal Imaging Scanning Microscopy produces a rapid, thermal-based, non-destructive characterization apparatus. Also, a photothermal characterization method of surface and subsurface features includes micron and nanoscale spatial resolution of meter-sized optical materials.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {2006},
month = {7}
}

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Works referenced in this record:

Overview of photothermal characterization of optical thin film coatings
conference, May 1996


Absorptance behavior of optical coatings for high-average-power laser applications
journal, January 2000


Damage threshold prediction of hafnia–silica multilayer coatings by nondestructive evaluation of fluence-limiting defects
journal, January 2001


Absorptance measurements of transmissive optical components by the surface thermal lensing technique
conference, April 1998


Photothermal deflection spectroscopy and detection
journal, January 1981