Method And Apparatus For Two Dimensional Surface Property Analysis Based On Boundary Measurement
Abstract
An apparatus and method for determining properties of a conductive film is disclosed. A plurality of probe locations selected around a periphery of the conductive film define a plurality of measurement lines between each probe location and all other probe locations. Electrical resistance may be measured along each of the measurement lines. A lumped parameter model may be developed based on the measured values of electrical resistance. The lumped parameter model may be used to estimate resistivity at one or more selected locations encompassed by the plurality of probe locations. The resistivity may be extrapolated to other physical properties if the conductive film includes a correlation between resistivity and the other physical properties. A profile of the conductive film may be developed by determining resistivity at a plurality of locations. The conductive film may be applied to a structure such that resistivity may be estimated and profiled for the structure's surface.
- Inventors:
-
- Idaho Falls, ID
- Issue Date:
- Research Org.:
- BECHTEL BWXT IDAHO LLC
- OSTI Identifier:
- 880425
- Patent Number(s):
- 6965836
- Application Number:
- 10/828633
- Assignee:
- Battelle Energy Alliance, LLC (Idaho Falls, ID)
- Patent Classifications (CPCs):
-
G - PHYSICS G01 - MEASURING G01N - INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- DOE Contract Number:
- AC07-99ID13727
- Resource Type:
- Patent
- Country of Publication:
- United States
- Language:
- English
Citation Formats
Richardson, John G. Method And Apparatus For Two Dimensional Surface Property Analysis Based On Boundary Measurement. United States: N. p., 2005.
Web.
Richardson, John G. Method And Apparatus For Two Dimensional Surface Property Analysis Based On Boundary Measurement. United States.
Richardson, John G. Tue .
"Method And Apparatus For Two Dimensional Surface Property Analysis Based On Boundary Measurement". United States. https://www.osti.gov/servlets/purl/880425.
@article{osti_880425,
title = {Method And Apparatus For Two Dimensional Surface Property Analysis Based On Boundary Measurement},
author = {Richardson, John G},
abstractNote = {An apparatus and method for determining properties of a conductive film is disclosed. A plurality of probe locations selected around a periphery of the conductive film define a plurality of measurement lines between each probe location and all other probe locations. Electrical resistance may be measured along each of the measurement lines. A lumped parameter model may be developed based on the measured values of electrical resistance. The lumped parameter model may be used to estimate resistivity at one or more selected locations encompassed by the plurality of probe locations. The resistivity may be extrapolated to other physical properties if the conductive film includes a correlation between resistivity and the other physical properties. A profile of the conductive film may be developed by determining resistivity at a plurality of locations. The conductive film may be applied to a structure such that resistivity may be estimated and profiled for the structure's surface.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {Tue Nov 15 00:00:00 EST 2005},
month = {Tue Nov 15 00:00:00 EST 2005}
}
Works referenced in this record:
Electrical impedance tomography system using 3D finite element algorithm
conference, January 2000
- Rerkratn, A.; Chitsakul, K.; Suwanna, P.
- 2000 TENCON Proceedings. Intelligent Systems and Technologies for the New Millennium (Cat. No.00CH37119)