Contoured Surface Eddy Current Inspection System
Abstract
Eddy current inspection of a contoured surface of a workpiece is performed by forming a backing piece of flexible, resiliently yieldable material with a contoured exterior surface conforming in shape to the workpiece contoured surface. The backing piece is preferably cast in place so as to conform to the workpiece contoured surface. A flexible eddy current array probe is attached to the contoured exterior surface of the backing piece such that the probe faces the contoured surface of the workpiece to be inspected when the backing piece is disposed adjacent to the workpiece. The backing piece is then expanded volumetrically by inserting at least one shim into a slot in the backing piece to provide sufficient contact pressure between the probe and the workpiece contoured surface to enable the inspection of the workpiece contoured surface to be performed.
- Inventors:
-
- Burnt Hills, NY
- Clifton Park, NY
- Mechanicville, NY
- Schenectady, NY
- Issue Date:
- Research Org.:
- General Electric Co., Boston, MA (United States)
- OSTI Identifier:
- 880240
- Patent Number(s):
- 6545467
- Application Number:
- 10/697256
- Assignee:
- General Electric Company (Niskayuna, NY)
- Patent Classifications (CPCs):
-
G - PHYSICS G01 - MEASURING G01N - INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- DOE Contract Number:
- FC21-95MC31176
- Resource Type:
- Patent
- Country of Publication:
- United States
- Language:
- English
Citation Formats
Batzinger, Thomas James, Fulton, James Paul, Rose, Curtis Wayne, and Perocchi, Lee Cranford. Contoured Surface Eddy Current Inspection System. United States: N. p., 2003.
Web.
Batzinger, Thomas James, Fulton, James Paul, Rose, Curtis Wayne, & Perocchi, Lee Cranford. Contoured Surface Eddy Current Inspection System. United States.
Batzinger, Thomas James, Fulton, James Paul, Rose, Curtis Wayne, and Perocchi, Lee Cranford. Tue .
"Contoured Surface Eddy Current Inspection System". United States. https://www.osti.gov/servlets/purl/880240.
@article{osti_880240,
title = {Contoured Surface Eddy Current Inspection System},
author = {Batzinger, Thomas James and Fulton, James Paul and Rose, Curtis Wayne and Perocchi, Lee Cranford},
abstractNote = {Eddy current inspection of a contoured surface of a workpiece is performed by forming a backing piece of flexible, resiliently yieldable material with a contoured exterior surface conforming in shape to the workpiece contoured surface. The backing piece is preferably cast in place so as to conform to the workpiece contoured surface. A flexible eddy current array probe is attached to the contoured exterior surface of the backing piece such that the probe faces the contoured surface of the workpiece to be inspected when the backing piece is disposed adjacent to the workpiece. The backing piece is then expanded volumetrically by inserting at least one shim into a slot in the backing piece to provide sufficient contact pressure between the probe and the workpiece contoured surface to enable the inspection of the workpiece contoured surface to be performed.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {Tue Apr 08 00:00:00 EDT 2003},
month = {Tue Apr 08 00:00:00 EDT 2003}
}