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Title: Contoured Surface Eddy Current Inspection System

Abstract

Eddy current inspection of a contoured surface of a workpiece is performed by forming a backing piece of flexible, resiliently yieldable material with a contoured exterior surface conforming in shape to the workpiece contoured surface. The backing piece is preferably cast in place so as to conform to the workpiece contoured surface. A flexible eddy current array probe is attached to the contoured exterior surface of the backing piece such that the probe faces the contoured surface of the workpiece to be inspected when the backing piece is disposed adjacent to the workpiece. The backing piece is then expanded volumetrically by inserting at least one shim into a slot in the backing piece to provide sufficient contact pressure between the probe and the workpiece contoured surface to enable the inspection of the workpiece contoured surface to be performed.

Inventors:
 [1];  [2];  [3];  [4]
  1. (Burnt Hills, NY)
  2. (Clifton Park, NY)
  3. (Mechanicville, NY)
  4. (Schenectady, NY)
Issue Date:
Research Org.:
GENERAL ELECTRIC CO
OSTI Identifier:
880240
Patent Number(s):
6545467
Application Number:
10/697256
Assignee:
General Electric Company (Niskayuna, NY) NETL
DOE Contract Number:  
FC21-95MC31176
Resource Type:
Patent
Country of Publication:
United States
Language:
English

Citation Formats

Batzinger, Thomas James, Fulton, James Paul, Rose, Curtis Wayne, and Perocchi, Lee Cranford. Contoured Surface Eddy Current Inspection System. United States: N. p., 2003. Web.
Batzinger, Thomas James, Fulton, James Paul, Rose, Curtis Wayne, & Perocchi, Lee Cranford. Contoured Surface Eddy Current Inspection System. United States.
Batzinger, Thomas James, Fulton, James Paul, Rose, Curtis Wayne, and Perocchi, Lee Cranford. Tue . "Contoured Surface Eddy Current Inspection System". United States. https://www.osti.gov/servlets/purl/880240.
@article{osti_880240,
title = {Contoured Surface Eddy Current Inspection System},
author = {Batzinger, Thomas James and Fulton, James Paul and Rose, Curtis Wayne and Perocchi, Lee Cranford},
abstractNote = {Eddy current inspection of a contoured surface of a workpiece is performed by forming a backing piece of flexible, resiliently yieldable material with a contoured exterior surface conforming in shape to the workpiece contoured surface. The backing piece is preferably cast in place so as to conform to the workpiece contoured surface. A flexible eddy current array probe is attached to the contoured exterior surface of the backing piece such that the probe faces the contoured surface of the workpiece to be inspected when the backing piece is disposed adjacent to the workpiece. The backing piece is then expanded volumetrically by inserting at least one shim into a slot in the backing piece to provide sufficient contact pressure between the probe and the workpiece contoured surface to enable the inspection of the workpiece contoured surface to be performed.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {2003},
month = {4}
}

Patent:

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