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Title: Ion Monitoring

Abstract

The apparatus and method provide a technique for significantly reducing capacitance effects in detector electrodes arising due to movement of the instrument relative to the item/location being monitored in ion detection based techniques. The capacitance variations are rendered less significant by placing an electrically conducting element between the detector electrodes and the monitored location/item. Improved sensitivity and reduced noise signals arise as a result. The technique also provides apparatus and method suitable for monitoring elongate items which are unsuited to complete enclosure in one go within a chamber. The items are monitored part by part as the pass through the instrument, so increasing the range of items or locations which can be successfully monitored.

Inventors:
 [1];  [1];  [1];  [2]
  1. (Calderbridge, GB)
  2. (Los Alamos, NM)
Issue Date:
Research Org.:
Los Alamos National Laboratory
OSTI Identifier:
879786
Patent Number(s):
6649916
Application Number:
10/163437
Assignee:
British Nuclear Fuels PLC (Risley, GB) OSTI
DOE Contract Number:  
W-7405-ENG-36
Resource Type:
Patent
Country of Publication:
United States
Language:
English

Citation Formats

Orr, Christopher Henry, Luff, Craig Janson, Dockray, Thomas, and Macarthur, Duncan Whittemore. Ion Monitoring. United States: N. p., 2003. Web.
Orr, Christopher Henry, Luff, Craig Janson, Dockray, Thomas, & Macarthur, Duncan Whittemore. Ion Monitoring. United States.
Orr, Christopher Henry, Luff, Craig Janson, Dockray, Thomas, and Macarthur, Duncan Whittemore. Tue . "Ion Monitoring". United States. https://www.osti.gov/servlets/purl/879786.
@article{osti_879786,
title = {Ion Monitoring},
author = {Orr, Christopher Henry and Luff, Craig Janson and Dockray, Thomas and Macarthur, Duncan Whittemore},
abstractNote = {The apparatus and method provide a technique for significantly reducing capacitance effects in detector electrodes arising due to movement of the instrument relative to the item/location being monitored in ion detection based techniques. The capacitance variations are rendered less significant by placing an electrically conducting element between the detector electrodes and the monitored location/item. Improved sensitivity and reduced noise signals arise as a result. The technique also provides apparatus and method suitable for monitoring elongate items which are unsuited to complete enclosure in one go within a chamber. The items are monitored part by part as the pass through the instrument, so increasing the range of items or locations which can be successfully monitored.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {2003},
month = {11}
}

Patent:

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