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Title: Method And Apparatus For Evaluatin Of High Temperature Superconductors

A technique for evaluation of high-T.sub.c superconducting films and single crystals is based on measurement of temperature dependence of differential optical reflectivity of high-T.sub.c materials. In the claimed method, specific parameters of the superconducting transition such as the critical temperature, anisotropy of the differential optical reflectivity response, and the part of the optical losses related to sample quality are measured. The apparatus for performing this technique includes pump and probe sources, cooling means for sweeping sample temperature across the critical temperature and polarization controller for controlling a state of polarization of a probe light beam.
Inventors:
 [1];  [2]
  1. (Palo Alto, CA)
  2. (Stanford, CA)
Issue Date:
OSTI Identifier:
879246
Assignee:
The Board of Trustees of the Leland Stanford Junior University (Stanford, CA) OAK
Patent Number(s):
US 5574562
Application Number:
08/359283
Contract Number:
FG03-90ER14157
Research Org:
Stanford Univ., CA (United States)
Country of Publication:
United States
Language:
English

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