Method And Apparatus For Evaluatin Of High Temperature Superconductors
Abstract
A technique for evaluation of high-T.sub.c superconducting films and single crystals is based on measurement of temperature dependence of differential optical reflectivity of high-T.sub.c materials. In the claimed method, specific parameters of the superconducting transition such as the critical temperature, anisotropy of the differential optical reflectivity response, and the part of the optical losses related to sample quality are measured. The apparatus for performing this technique includes pump and probe sources, cooling means for sweeping sample temperature across the critical temperature and polarization controller for controlling a state of polarization of a probe light beam.
- Inventors:
-
- Palo Alto, CA
- Stanford, CA
- Issue Date:
- Research Org.:
- Stanford Univ., CA (United States)
- OSTI Identifier:
- 879246
- Patent Number(s):
- 5574562
- Application Number:
- 08/359283
- Assignee:
- The Board of Trustees of the Leland Stanford Junior University (Stanford, CA)
- Patent Classifications (CPCs):
-
G - PHYSICS G01 - MEASURING G01N - INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- DOE Contract Number:
- FG03-90ER14157
- Resource Type:
- Patent
- Country of Publication:
- United States
- Language:
- English
Citation Formats
Fishman, Ilya M, and Kino, Gordon S. Method And Apparatus For Evaluatin Of High Temperature Superconductors. United States: N. p., 1996.
Web.
Fishman, Ilya M, & Kino, Gordon S. Method And Apparatus For Evaluatin Of High Temperature Superconductors. United States.
Fishman, Ilya M, and Kino, Gordon S. Tue .
"Method And Apparatus For Evaluatin Of High Temperature Superconductors". United States. https://www.osti.gov/servlets/purl/879246.
@article{osti_879246,
title = {Method And Apparatus For Evaluatin Of High Temperature Superconductors},
author = {Fishman, Ilya M and Kino, Gordon S},
abstractNote = {A technique for evaluation of high-T.sub.c superconducting films and single crystals is based on measurement of temperature dependence of differential optical reflectivity of high-T.sub.c materials. In the claimed method, specific parameters of the superconducting transition such as the critical temperature, anisotropy of the differential optical reflectivity response, and the part of the optical losses related to sample quality are measured. The apparatus for performing this technique includes pump and probe sources, cooling means for sweeping sample temperature across the critical temperature and polarization controller for controlling a state of polarization of a probe light beam.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {1996},
month = {11}
}
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Works referenced in this record:
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