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Title: High resolution energy-sensitive digital X-ray

An apparatus and method for detecting an x-ray and for determining the depth of penetration of an x-ray into a semiconductor strip detector. In one embodiment, a semiconductor strip detector formed of semiconductor material is disposed in an edge-on orientation towards an x-ray source such that x-rays from the x-ray source are incident upon and substantially perpendicular to the front edge of the semiconductor strip detector. The semiconductor strip detector is formed of a plurality of segments. The segments are coupled together in a collinear arrangement such that the semiconductor strip detector has a length great enough such that substantially all of the x-rays incident on the front edge of the semiconductor strip detector interact with the semiconductor material which forms the semiconductor strip detector. A plurality of electrodes are connected to the semiconductor strip detector such that each one of the semiconductor strip detector segments has at least one of the of electrodes coupled thereto. A signal processor is also coupled to each one of the electrodes. The present detector detects an interaction within the semiconductor strip detector, between an x-ray and the semiconductor material, and also indicates the depth of penetration of the x-ray into the semiconductor stripmore » detector at the time of the interaction. 5 figs.« less
Inventors:
Issue Date:
OSTI Identifier:
87764
Assignee:
Univ. of California, Oakland, CA (United States) PTO; SCA: 440101; PA: EDB-95:119647; SN: 95001431589
Patent Number(s):
US 5,434,417/A/
Application Number:
PAN: 8-148,151
Contract Number:
AC03-76SF00098
Resource Relation:
Other Information: PBD: 18 Jul 1995
Research Org:
University of California
Country of Publication:
United States
Language:
English
Subject:
44 INSTRUMENTATION, INCLUDING NUCLEAR AND PARTICLE DETECTORS; X-RAY DETECTION; RADIATION DETECTORS; SEMICONDUCTOR DETECTORS; DIAGNOSTIC TECHNIQUES; MEASURING METHODS; X RADIATION