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Title: Method and apparatus for ceramic analysis

Abstract

The present invention relates to a method and apparatus for ceramic analysis, in particular, a method for analyzing density, density gradients and/or microcracks, including an apparatus with optical instrumentation for analysis of density, density gradients and/or microcracks in ceramics. The method provides analyzing density of a ceramic comprising exciting a component on a surface/subsurface of the ceramic by exposing the material to excitation energy. The method may further include the step of obtaining a measurement of an emitted energy from the component. The method may additionally include comparing the measurement of the emitted energy from the component with a predetermined reference measurement so as to obtain a density for said ceramic.

Inventors:
 [1];  [1];  [1];  [2]
  1. (Ames, IA)
  2. (Cracow, PL)
Issue Date:
Research Org.:
Ames Laboratory (AMES), Ames, IA; Iowa State University, Ames, IA (US)
OSTI Identifier:
875142
Patent Number(s):
6541778
Application Number:
09/556,008
Assignee:
Iowa State University Research Foundation, Inc. (Ames, IA) AMES
DOE Contract Number:  
W-7405-ENG-82
Resource Type:
Patent
Country of Publication:
United States
Language:
English
Subject:
method; apparatus; ceramic; analysis; relates; analyzing; density; gradients; andor; microcracks; including; optical; instrumentation; ceramics; provides; comprising; exciting; component; surfacesubsurface; exposing; material; excitation; energy; step; obtaining; measurement; emitted; additionally; comparing; predetermined; reference; obtain; density gradient; /250/

Citation Formats

Jankowiak, Ryszard J., Schilling, Chris, Small, Gerald J., and Tomasik, Piotr. Method and apparatus for ceramic analysis. United States: N. p., 2003. Web.
Jankowiak, Ryszard J., Schilling, Chris, Small, Gerald J., & Tomasik, Piotr. Method and apparatus for ceramic analysis. United States.
Jankowiak, Ryszard J., Schilling, Chris, Small, Gerald J., and Tomasik, Piotr. Tue . "Method and apparatus for ceramic analysis". United States. https://www.osti.gov/servlets/purl/875142.
@article{osti_875142,
title = {Method and apparatus for ceramic analysis},
author = {Jankowiak, Ryszard J. and Schilling, Chris and Small, Gerald J. and Tomasik, Piotr},
abstractNote = {The present invention relates to a method and apparatus for ceramic analysis, in particular, a method for analyzing density, density gradients and/or microcracks, including an apparatus with optical instrumentation for analysis of density, density gradients and/or microcracks in ceramics. The method provides analyzing density of a ceramic comprising exciting a component on a surface/subsurface of the ceramic by exposing the material to excitation energy. The method may further include the step of obtaining a measurement of an emitted energy from the component. The method may additionally include comparing the measurement of the emitted energy from the component with a predetermined reference measurement so as to obtain a density for said ceramic.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {2003},
month = {4}
}

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