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Title: Method for localizing and isolating an errant process step

Abstract

A method for localizing and isolating an errant process includes the steps of retrieving from a defect image database a selection of images each image having image content similar to image content extracted from a query image depicting a defect, each image in the selection having corresponding defect characterization data. A conditional probability distribution of the defect having occurred in a particular process step is derived from the defect characterization data. A process step as a highest probable source of the defect according to the derived conditional probability distribution is then identified. A method for process step defect identification includes the steps of characterizing anomalies in a product, the anomalies detected by an imaging system. A query image of a product defect is then acquired. A particular characterized anomaly is then correlated with the query image. An errant process step is then associated with the correlated image.

Inventors:
 [1];  [2];  [2]
  1. (Harriman, TN)
  2. (Knoxville, TN)
Issue Date:
Research Org.:
LOCKHEED MARTIN ENERGY RES COR
OSTI Identifier:
875118
Patent Number(s):
6535776
Assignee:
Ut-Battelle, LLC (Oak Ridge, TN) ORNL
DOE Contract Number:  
AC05-96OR22464
Resource Type:
Patent
Country of Publication:
United States
Language:
English
Subject:
method; localizing; isolating; errant; process; step; steps; retrieving; defect; image; database; selection; images; content; similar; extracted; query; depicting; characterization; data; conditional; probability; distribution; occurred; derived; probable; source; identified; identification; characterizing; anomalies; product; detected; imaging; acquired; characterized; anomaly; correlated; associated; image data; /700/382/

Citation Formats

Tobin, Jr., Kenneth W., Karnowski, Thomas P., and Ferrell, Regina K. Method for localizing and isolating an errant process step. United States: N. p., 2003. Web.
Tobin, Jr., Kenneth W., Karnowski, Thomas P., & Ferrell, Regina K. Method for localizing and isolating an errant process step. United States.
Tobin, Jr., Kenneth W., Karnowski, Thomas P., and Ferrell, Regina K. Wed . "Method for localizing and isolating an errant process step". United States. https://www.osti.gov/servlets/purl/875118.
@article{osti_875118,
title = {Method for localizing and isolating an errant process step},
author = {Tobin, Jr., Kenneth W. and Karnowski, Thomas P. and Ferrell, Regina K.},
abstractNote = {A method for localizing and isolating an errant process includes the steps of retrieving from a defect image database a selection of images each image having image content similar to image content extracted from a query image depicting a defect, each image in the selection having corresponding defect characterization data. A conditional probability distribution of the defect having occurred in a particular process step is derived from the defect characterization data. A process step as a highest probable source of the defect according to the derived conditional probability distribution is then identified. A method for process step defect identification includes the steps of characterizing anomalies in a product, the anomalies detected by an imaging system. A query image of a product defect is then acquired. A particular characterized anomaly is then correlated with the query image. An errant process step is then associated with the correlated image.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {2003},
month = {1}
}

Patent:

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