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Title: Sample inlet tube for ion source

Abstract

An improved inlet tube is positioned within an aperture through the device to allow the passage of ions from the ion source, through the improved inlet tube, and into the interior of the device. The inlet tube is designed with a larger end and a smaller end wherein the larger end has a larger interior diameter than the interior diameter of the smaller end. The inlet tube is positioned within the aperture such that the larger end is pointed towards the ion source, to receive ions therefrom, and the smaller end is directed towards the interior of the device, to deliver the ions thereto. Preferably, the ion source utilized in the operation of the present invention is a standard electrospray ionization source. Similarly, the present invention finds particular utility in conjunction with analytical devices such as mass spectrometers.

Inventors:
 [1];  [2];  [3]
  1. Hermiston, OR
  2. Richland, WA
  3. Oceanside, CA
Issue Date:
Research Org.:
Pacific Northwest National Lab. (PNNL), Richland, WA (United States)
Sponsoring Org.:
USDOE
OSTI Identifier:
874762
Patent Number(s):
6455846
Assignee:
Battelle Memorial Institute (Richland, WA)
Patent Classifications (CPCs):
H - ELECTRICITY H01 - BASIC ELECTRIC ELEMENTS H01J - ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
DOE Contract Number:  
AC06-76RL01830
Resource Type:
Patent
Country of Publication:
United States
Language:
English
Subject:
sample; inlet; tube; source; improved; positioned; aperture; device; allow; passage; interior; designed; larger; diameter; towards; receive; directed; deliver; utilized; operation; standard; electrospray; ionization; similarly; utility; conjunction; analytical; devices; mass; spectrometers; mass spectrometer; ionization source; inlet tube; /250/

Citation Formats

Prior, David, Price, John, and Bruce, Jim. Sample inlet tube for ion source. United States: N. p., 2002. Web.
Prior, David, Price, John, & Bruce, Jim. Sample inlet tube for ion source. United States.
Prior, David, Price, John, and Bruce, Jim. Tue . "Sample inlet tube for ion source". United States. https://www.osti.gov/servlets/purl/874762.
@article{osti_874762,
title = {Sample inlet tube for ion source},
author = {Prior, David and Price, John and Bruce, Jim},
abstractNote = {An improved inlet tube is positioned within an aperture through the device to allow the passage of ions from the ion source, through the improved inlet tube, and into the interior of the device. The inlet tube is designed with a larger end and a smaller end wherein the larger end has a larger interior diameter than the interior diameter of the smaller end. The inlet tube is positioned within the aperture such that the larger end is pointed towards the ion source, to receive ions therefrom, and the smaller end is directed towards the interior of the device, to deliver the ions thereto. Preferably, the ion source utilized in the operation of the present invention is a standard electrospray ionization source. Similarly, the present invention finds particular utility in conjunction with analytical devices such as mass spectrometers.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {2002},
month = {9}
}

Patent:

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