Apparatus for measurement of critical current in superconductive tapes
Abstract
A cryogenic linear positioner which is primarily used for characterizing coated conductor critical current homogeneity at 75K is disclosed. Additionally, this tool can be used to measure the positional dependence of the coated conductor resistance at room temperature, and the room temperature resistance of the underlying YBCB coating without the overlaying protective cover of silver.
- Inventors:
-
- Santa Fe, NM
- Issue Date:
- Research Org.:
- Los Alamos National Laboratory (LANL), Los Alamos, NM (United States)
- OSTI Identifier:
- 874743
- Patent Number(s):
- 6452375
- Assignee:
- The Regents of the University of California (Los Alamos, NM)
- Patent Classifications (CPCs):
-
G - PHYSICS G01 - MEASURING G01R - MEASURING ELECTRIC VARIABLES
- DOE Contract Number:
- W-7405-ENG-36
- Resource Type:
- Patent
- Country of Publication:
- United States
- Language:
- English
- Subject:
- apparatus; measurement; critical; current; superconductive; tapes; cryogenic; linear; positioner; primarily; characterizing; coated; conductor; homogeneity; 75k; disclosed; additionally; tool; measure; positional; dependence; resistance; temperature; underlying; ybcb; coating; overlaying; protective; cover; silver; critical current; /324/
Citation Formats
Coulter, J Yates, and DePaula, Raymond. Apparatus for measurement of critical current in superconductive tapes. United States: N. p., 2002.
Web.
Coulter, J Yates, & DePaula, Raymond. Apparatus for measurement of critical current in superconductive tapes. United States.
Coulter, J Yates, and DePaula, Raymond. Tue .
"Apparatus for measurement of critical current in superconductive tapes". United States. https://www.osti.gov/servlets/purl/874743.
@article{osti_874743,
title = {Apparatus for measurement of critical current in superconductive tapes},
author = {Coulter, J Yates and DePaula, Raymond},
abstractNote = {A cryogenic linear positioner which is primarily used for characterizing coated conductor critical current homogeneity at 75K is disclosed. Additionally, this tool can be used to measure the positional dependence of the coated conductor resistance at room temperature, and the room temperature resistance of the underlying YBCB coating without the overlaying protective cover of silver.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {2002},
month = {1}
}
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