Method and apparatus for determining the coordinates of an object
Abstract
A simplified method and related apparatus are described for determining the location of points on the surface of an object by varying, in accordance with a unique sequence, the intensity of each illuminated pixel directed to the object surface, and detecting at known detector pixel locations the intensity sequence of reflected illumination from the surface of the object whereby the identity and location of the originating illuminated pixel can be determined. The coordinates of points on the surface of the object are then determined by conventional triangulation methods.
- Inventors:
-
- Los Alamos, NM
- Issue Date:
- Research Org.:
- Los Alamos National Laboratory (LANL), Los Alamos, NM (United States)
- OSTI Identifier:
- 874339
- Patent Number(s):
- 6369879
- Assignee:
- The Regents of the University of California (Los Alamos, CA)
- Patent Classifications (CPCs):
-
G - PHYSICS G01 - MEASURING G01B - MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS
- DOE Contract Number:
- W-7405-ENG-36
- Resource Type:
- Patent
- Country of Publication:
- United States
- Language:
- English
- Subject:
- method; apparatus; determining; coordinates; simplified; related; described; location; surface; varying; unique; sequence; intensity; illuminated; pixel; directed; detecting; detector; locations; reflected; illumination; identity; originating; determined; conventional; triangulation; methods; /356/
Citation Formats
Pedersen, Paul S. Method and apparatus for determining the coordinates of an object. United States: N. p., 2002.
Web.
Pedersen, Paul S. Method and apparatus for determining the coordinates of an object. United States.
Pedersen, Paul S. Tue .
"Method and apparatus for determining the coordinates of an object". United States. https://www.osti.gov/servlets/purl/874339.
@article{osti_874339,
title = {Method and apparatus for determining the coordinates of an object},
author = {Pedersen, Paul S},
abstractNote = {A simplified method and related apparatus are described for determining the location of points on the surface of an object by varying, in accordance with a unique sequence, the intensity of each illuminated pixel directed to the object surface, and detecting at known detector pixel locations the intensity sequence of reflected illumination from the surface of the object whereby the identity and location of the originating illuminated pixel can be determined. The coordinates of points on the surface of the object are then determined by conventional triangulation methods.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {2002},
month = {1}
}
Save to My Library
You must Sign In or Create an Account in order to save documents to your library.
Works referenced in this record:
General hierarchical approach in absolute phase measurement
conference, July 1996
- Osten, Wolfgang; Nadeborn, Werner; Andrae, Peter
- SPIE's 1996 International Symposium on Optical Science, Engineering, and Instrumentation, SPIE Proceedings