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Title: Monitoring materials

Abstract

The apparatus and method provide techniques for effectively implementing alpha and/or beta and/or gamma monitoring of items or locations as desired. Indirect alpha monitoring by detecting ions generated by alpha emissions, in conjunction with beta and/or gamma monitoring is provided. The invention additionally provides for screening of items prior to alpha monitoring using beta and/or gamma monitoring, so as to ensure that the alpha monitoring apparatus is not contaminated by proceeding direct to alpha monitoring of a heavily contaminated item or location. The invention provides additional versatility in the emission forms which can be monitored, whilst maintaining accuracy and avoiding inadvertent contamination.

Inventors:
 [1];  [1];  [1];  [2]
  1. Calderbridge, GB
  2. Los Alamos, NM
Issue Date:
Research Org.:
Los Alamos National Lab. (LANL), Los Alamos, NM (United States)
OSTI Identifier:
874266
Patent Number(s):
6353230
Assignee:
British Nuclear Fuels PLC (Cheshire, GB); The Regents of the University of California (Oakland, CA)
Patent Classifications (CPCs):
G - PHYSICS G01 - MEASURING G01T - MEASUREMENT OF NUCLEAR OR X-RADIATION
DOE Contract Number:  
W-7405-ENG-36
Resource Type:
Patent
Country of Publication:
United States
Language:
English
Subject:
monitoring; materials; apparatus; method; provide; techniques; effectively; implementing; alpha; andor; beta; gamma; items; locations; indirect; detecting; generated; emissions; conjunction; provided; additionally; provides; screening; prior; ensure; contaminated; proceeding; direct; heavily; item; location; additional; versatility; emission; forms; monitored; whilst; maintaining; accuracy; avoiding; inadvertent; contamination; /250/

Citation Formats

Orr, Christopher Henry, Luff, Craig Janson, Dockray, Thomas, and Macarthur, Duncan Whittemore. Monitoring materials. United States: N. p., 2002. Web.
Orr, Christopher Henry, Luff, Craig Janson, Dockray, Thomas, & Macarthur, Duncan Whittemore. Monitoring materials. United States.
Orr, Christopher Henry, Luff, Craig Janson, Dockray, Thomas, and Macarthur, Duncan Whittemore. Tue . "Monitoring materials". United States. https://www.osti.gov/servlets/purl/874266.
@article{osti_874266,
title = {Monitoring materials},
author = {Orr, Christopher Henry and Luff, Craig Janson and Dockray, Thomas and Macarthur, Duncan Whittemore},
abstractNote = {The apparatus and method provide techniques for effectively implementing alpha and/or beta and/or gamma monitoring of items or locations as desired. Indirect alpha monitoring by detecting ions generated by alpha emissions, in conjunction with beta and/or gamma monitoring is provided. The invention additionally provides for screening of items prior to alpha monitoring using beta and/or gamma monitoring, so as to ensure that the alpha monitoring apparatus is not contaminated by proceeding direct to alpha monitoring of a heavily contaminated item or location. The invention provides additional versatility in the emission forms which can be monitored, whilst maintaining accuracy and avoiding inadvertent contamination.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {2002},
month = {1}
}

Patent:

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