Crystal phase identification
Abstract
A method and apparatus for determining the crystalline phase and crystalline characteristics of a sample. This invention provides a method and apparatus for unambiguously identifying and determining the crystalline phase and crystalline characteristics of a sample by using an electron beam generator, such as a scanning electron microscope, to obtain a backscattered electron Kikuchi pattern of a sample, and extracting crystallographic and composition data that is matched to database information to provide a quick and automatic method to identify crystalline phases.
- Inventors:
-
- Albuquerque, NM
- Issue Date:
- Research Org.:
- Sandia National Laboratories (SNL), Albuquerque, NM, and Livermore, CA (United States)
- OSTI Identifier:
- 874148
- Patent Number(s):
- 6326619
- Assignee:
- Sandia Corporation (Albuquerque, NM)
- Patent Classifications (CPCs):
-
G - PHYSICS G01 - MEASURING G01N - INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
H - ELECTRICITY H01 - BASIC ELECTRIC ELEMENTS H01J - ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- DOE Contract Number:
- AC04-94AL85000
- Resource Type:
- Patent
- Country of Publication:
- United States
- Language:
- English
- Subject:
- crystal; phase; identification; method; apparatus; determining; crystalline; characteristics; sample; provides; unambiguously; identifying; electron; beam; generator; scanning; microscope; obtain; backscattered; kikuchi; pattern; extracting; crystallographic; composition; data; matched; database; information; provide; quick; automatic; identify; phases; electron beam; crystalline phase; crystal phase; /250/
Citation Formats
Michael, Joseph R, Goehner, Raymond P, and Schlienger, Max E. Crystal phase identification. United States: N. p., 2001.
Web.
Michael, Joseph R, Goehner, Raymond P, & Schlienger, Max E. Crystal phase identification. United States.
Michael, Joseph R, Goehner, Raymond P, and Schlienger, Max E. Mon .
"Crystal phase identification". United States. https://www.osti.gov/servlets/purl/874148.
@article{osti_874148,
title = {Crystal phase identification},
author = {Michael, Joseph R and Goehner, Raymond P and Schlienger, Max E},
abstractNote = {A method and apparatus for determining the crystalline phase and crystalline characteristics of a sample. This invention provides a method and apparatus for unambiguously identifying and determining the crystalline phase and crystalline characteristics of a sample by using an electron beam generator, such as a scanning electron microscope, to obtain a backscattered electron Kikuchi pattern of a sample, and extracting crystallographic and composition data that is matched to database information to provide a quick and automatic method to identify crystalline phases.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {Mon Jan 01 00:00:00 EST 2001},
month = {Mon Jan 01 00:00:00 EST 2001}
}
Works referenced in this record:
Phase identification in a scanning electron microscope using backscattered electron Kikuchi patterns
journal, May 1996
- Goehner, R. P.; Michael, J. R.
- Journal of Research of the National Institute of Standards and Technology, Vol. 101, Issue 3