skip to main content
DOE Patents title logo U.S. Department of Energy
Office of Scientific and Technical Information

Title: Crystal phase identification

Abstract

A method and apparatus for determining the crystalline phase and crystalline characteristics of a sample. This invention provides a method and apparatus for unambiguously identifying and determining the crystalline phase and crystalline characteristics of a sample by using an electron beam generator, such as a scanning electron microscope, to obtain a backscattered electron Kikuchi pattern of a sample, and extracting crystallographic and composition data that is matched to database information to provide a quick and automatic method to identify crystalline phases.

Inventors:
 [1];  [1];  [1]
  1. (Albuquerque, NM)
Issue Date:
Research Org.:
SANDIA CORP
OSTI Identifier:
874148
Patent Number(s):
6326619
Assignee:
Sandia Corporation (Albuquerque, NM) SNL
DOE Contract Number:  
AC04-94AL85000
Resource Type:
Patent
Country of Publication:
United States
Language:
English
Subject:
crystal; phase; identification; method; apparatus; determining; crystalline; characteristics; sample; provides; unambiguously; identifying; electron; beam; generator; scanning; microscope; obtain; backscattered; kikuchi; pattern; extracting; crystallographic; composition; data; matched; database; information; provide; quick; automatic; identify; phases; electron beam; crystalline phase; crystal phase; /250/

Citation Formats

Michael, Joseph R., Goehner, Raymond P., and Schlienger, Max E. Crystal phase identification. United States: N. p., 2001. Web.
Michael, Joseph R., Goehner, Raymond P., & Schlienger, Max E. Crystal phase identification. United States.
Michael, Joseph R., Goehner, Raymond P., and Schlienger, Max E. Mon . "Crystal phase identification". United States. https://www.osti.gov/servlets/purl/874148.
@article{osti_874148,
title = {Crystal phase identification},
author = {Michael, Joseph R. and Goehner, Raymond P. and Schlienger, Max E.},
abstractNote = {A method and apparatus for determining the crystalline phase and crystalline characteristics of a sample. This invention provides a method and apparatus for unambiguously identifying and determining the crystalline phase and crystalline characteristics of a sample by using an electron beam generator, such as a scanning electron microscope, to obtain a backscattered electron Kikuchi pattern of a sample, and extracting crystallographic and composition data that is matched to database information to provide a quick and automatic method to identify crystalline phases.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {2001},
month = {1}
}

Patent:

Save / Share: