DOE Patents title logo U.S. Department of Energy
Office of Scientific and Technical Information

Title: Phase-shifting point diffraction interferometer phase grating designs

Abstract

Diffraction phase gratings are employed in phase-shifting point diffraction interferometers to improve the interferometric fringe contrast. The diffraction phase grating diffracts a zeroth-order diffraction of light at a first power level to the test-beam window of a mask that is positioned at the image plane and a first-order diffraction at a second power to the reference-beam pinhole. The diffraction phase grating is preferably selected to yield a desired ratio of the first power level to second power level.

Inventors:
 [1]
  1. Oakland, CA
Issue Date:
Research Org.:
Lawrence Berkeley National Laboratory (LBNL), Berkeley, CA (United States)
OSTI Identifier:
873886
Patent Number(s):
6266147
Assignee:
Regents of University of California (Oakland, CA)
Patent Classifications (CPCs):
G - PHYSICS G01 - MEASURING G01B - MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS
DOE Contract Number:  
AC03-76SF00098
Resource Type:
Patent
Country of Publication:
United States
Language:
English
Subject:
phase-shifting; diffraction; interferometer; phase; grating; designs; gratings; employed; interferometers; improve; interferometric; fringe; contrast; diffracts; zeroth-order; light; power; level; test-beam; window; mask; positioned; image; plane; first-order; reference-beam; pinhole; preferably; selected; yield; desired; ratio; image plane; diffraction interferometer; power level; beam window; phase grating; preferably selected; fringe contrast; desired ratio; diffraction phase; zeroth-order diffraction; grating designs; first-order diffraction; /356/

Citation Formats

Naulleau, Patrick. Phase-shifting point diffraction interferometer phase grating designs. United States: N. p., 2001. Web.
Naulleau, Patrick. Phase-shifting point diffraction interferometer phase grating designs. United States.
Naulleau, Patrick. Mon . "Phase-shifting point diffraction interferometer phase grating designs". United States. https://www.osti.gov/servlets/purl/873886.
@article{osti_873886,
title = {Phase-shifting point diffraction interferometer phase grating designs},
author = {Naulleau, Patrick},
abstractNote = {Diffraction phase gratings are employed in phase-shifting point diffraction interferometers to improve the interferometric fringe contrast. The diffraction phase grating diffracts a zeroth-order diffraction of light at a first power level to the test-beam window of a mask that is positioned at the image plane and a first-order diffraction at a second power to the reference-beam pinhole. The diffraction phase grating is preferably selected to yield a desired ratio of the first power level to second power level.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {Mon Jan 01 00:00:00 EST 2001},
month = {Mon Jan 01 00:00:00 EST 2001}
}

Works referenced in this record:

Electron beam lithography digital pattern generator and electronics for generalized curvilinear structures
journal, November 1995


Phase-shifting point diffraction interferometer
journal, January 1996


Phase-measuring interferometry using extreme ultraviolet radiation
journal, November 1995


Effect of intensity error correlation on the computed phase of phase-shifting interferometry
journal, January 1990


Characterization of the accuracy of EUV phase-shifting point diffraction interferometry
conference, June 1998

  • Naulleau, Patrick P.; Goldberg, Kenneth A.; Lee, Sang Hun
  • 23rd Annual International Symposium on Microlithography, SPIE Proceedings
  • https://doi.org/10.1117/12.309563