skip to main content
DOE Patents title logo U.S. Department of Energy
Office of Scientific and Technical Information

Title: Apparatus for reduction of selected ion intensities in confined ion beams

Abstract

An apparatus for producing an ion beam having an increased proportion of analyte ions compared to carrier gas ions is disclosed. Specifically, the apparatus has an ion trap or a collision cell containing a reagent gas wherein the reagent gas accepts charge from the analyte ions thereby selectively neutralizing the carrier gas ions. Also disclosed is the collision cell as employed in various locations within analytical instruments including an inductively coupled plasma mass spectrometer.

Inventors:
 [1];  [1];  [1]
  1. Richland, WA
Issue Date:
Research Org.:
Pacific Northwest National Lab. (PNNL), Richland, WA (United States)
OSTI Identifier:
873849
Patent Number(s):
6259091
Assignee:
Battelle Memorial Institute (Richland, WA)
Patent Classifications (CPCs):
H - ELECTRICITY H01 - BASIC ELECTRIC ELEMENTS H01J - ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
DOE Contract Number:  
AC06-76RL01830
Resource Type:
Patent
Country of Publication:
United States
Language:
English
Subject:
apparatus; reduction; selected; intensities; confined; beams; producing; beam; increased; proportion; analyte; compared; carrier; gas; disclosed; specifically; trap; collision; cell; containing; reagent; accepts; charge; selectively; neutralizing; employed; various; locations; analytical; instruments; including; inductively; coupled; plasma; mass; spectrometer; analytical instruments; inductively coupled; mass spectrometer; carrier gas; coupled plasma; cell containing; various locations; selectively neutralizing; analytical instrument; increased proportion; cell contain; /250/

Citation Formats

Eiden, Gregory C, Barinaga, Charles J, and Koppenaal, David W. Apparatus for reduction of selected ion intensities in confined ion beams. United States: N. p., 2001. Web.
Eiden, Gregory C, Barinaga, Charles J, & Koppenaal, David W. Apparatus for reduction of selected ion intensities in confined ion beams. United States.
Eiden, Gregory C, Barinaga, Charles J, and Koppenaal, David W. Mon . "Apparatus for reduction of selected ion intensities in confined ion beams". United States. https://www.osti.gov/servlets/purl/873849.
@article{osti_873849,
title = {Apparatus for reduction of selected ion intensities in confined ion beams},
author = {Eiden, Gregory C and Barinaga, Charles J and Koppenaal, David W},
abstractNote = {An apparatus for producing an ion beam having an increased proportion of analyte ions compared to carrier gas ions is disclosed. Specifically, the apparatus has an ion trap or a collision cell containing a reagent gas wherein the reagent gas accepts charge from the analyte ions thereby selectively neutralizing the carrier gas ions. Also disclosed is the collision cell as employed in various locations within analytical instruments including an inductively coupled plasma mass spectrometer.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {2001},
month = {1}
}

Patent:

Save / Share: