skip to main content
DOE Patents title logo U.S. Department of Energy
Office of Scientific and Technical Information

Title: Null test fourier domain alignment technique for phase-shifting point diffraction interferometer

Abstract

Alignment technique for calibrating a phase-shifting point diffraction interferometer involves three independent steps where the first two steps independently align the image points and pinholes in rotation and separation to a fixed reference coordinate system, e.g, CCD. Once the two sub-elements have been properly aligned to the reference in two parameters (separation and orientation), the third step is to align the two sub-element coordinate systems to each other in the two remaining parameters (x,y) using standard methods of locating the pinholes relative to some easy to find reference point.

Inventors:
 [1];  [2]
  1. (5239 Miles Ave., Apt. A, Oakland, CA 94618)
  2. (1622 Oxford St., #5t, Berkeley, CA 94709)
Issue Date:
Research Org.:
Lawrence Berkeley National Laboratory (LBNL), Berkeley, CA
OSTI Identifier:
873207
Patent Number(s):
6111646
Assignee:
Naulleau, Patrick (5239 Miles Ave., Apt. A, Oakland, CA 94618);Goldberg, Kenneth Alan (1622 Oxford St., #5t, Berkeley, CA 94709) LBNL
DOE Contract Number:  
AC03-76SF00098
Resource Type:
Patent
Country of Publication:
United States
Language:
English
Subject:
fourier; domain; alignment; technique; phase-shifting; diffraction; interferometer; calibrating; involves; independent; steps; independently; align; image; pinholes; rotation; separation; fixed; reference; coordinate; ccd; sub-elements; properly; aligned; parameters; orientation; third; step; sub-element; systems; remaining; standard; methods; locating; relative; easy; third step; diffraction interferometer; properly aligned; fixed reference; alignment technique; /356/

Citation Formats

Naulleau, Patrick, and Goldberg, Kenneth Alan. Null test fourier domain alignment technique for phase-shifting point diffraction interferometer. United States: N. p., 2000. Web.
Naulleau, Patrick, & Goldberg, Kenneth Alan. Null test fourier domain alignment technique for phase-shifting point diffraction interferometer. United States.
Naulleau, Patrick, and Goldberg, Kenneth Alan. Sat . "Null test fourier domain alignment technique for phase-shifting point diffraction interferometer". United States. https://www.osti.gov/servlets/purl/873207.
@article{osti_873207,
title = {Null test fourier domain alignment technique for phase-shifting point diffraction interferometer},
author = {Naulleau, Patrick and Goldberg, Kenneth Alan},
abstractNote = {Alignment technique for calibrating a phase-shifting point diffraction interferometer involves three independent steps where the first two steps independently align the image points and pinholes in rotation and separation to a fixed reference coordinate system, e.g, CCD. Once the two sub-elements have been properly aligned to the reference in two parameters (separation and orientation), the third step is to align the two sub-element coordinate systems to each other in the two remaining parameters (x,y) using standard methods of locating the pinholes relative to some easy to find reference point.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {2000},
month = {1}
}

Patent:

Save / Share: