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Title: Method and apparatus for measuring micro structures, anisotropy and birefringence in polymers using laser scattered light

A method and apparatus for measuring microstructures, anistropy and birefringence in polymers using laser scattered light includes a laser which provides a beam that can be conditioned and is directed at a fiber or film which causes the beam to scatter. Backscatter light is received and processed with detectors and beam splitters to obtain data. The data is directed to a computer where it is processed to obtain information about the fiber or film, such as the birefringence and diameter. This information provides a basis for modifications to the production process to enhance the process.
Inventors:
 [1];  [2];  [3]
  1. (Santa Clara, CA)
  2. (Livermore, CA)
  3. (Wilmington, DE)
Issue Date:
OSTI Identifier:
873130
Assignee:
Princeton University (Princeton, NJ) SNL
Patent Number(s):
US 6097488
Contract Number:
AC04-76
Research Org:
Sandia National Laboratories (SNL), Albuquerque, NM, and Livermore, CA
Country of Publication:
United States
Language:
English
Subject:
method; apparatus; measuring; micro; structures; anisotropy; birefringence; polymers; laser; scattered; light; microstructures; anistropy; provides; beam; conditioned; directed; fiber; film; causes; scatter; backscatter; received; processed; detectors; splitters; obtain; data; computer; information; diameter; basis; modifications; production; process; enhance; beam splitter; scattered light; backscatter light; obtain information; beam splitters; production process; measuring micro; laser scattered; /356/