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Title: Method for surface passivation and protection of cadmium zinc telluride crystals

Abstract

A method for reducing the leakage current in CZT crystals, particularly Cd.sub.1-x Zn.sub.x Te crystals (where x is greater than equal to zero and less than or equal to 0.5), and preferably Cd.sub.0.9 Zn.sub.0.1 Te crystals, thereby enhancing the ability of these crystal to spectrally resolve radiological emissions from a wide variety of radionuclides. Two processes are disclosed. The first method provides for depositing, via reactive sputtering, a silicon nitride hard-coat overlayer which provides significant reduction in surface leakage currents. The second method enhances the passivation by oxidizing the CZT surface with an oxygen plasma prior to silicon nitride deposition without breaking the vacuum state.

Inventors:
 [1];  [2];  [3];  [4]
  1. 5640 Hobart St., Apt. #9, Pittsburg, PA 15217
  2. 5420 Lenore Ave., Livermore, CA 94550
  3. 8 Carleton Dr., Mount Lebanon, PA 15243
  4. 3707 Carrigan Common, Livermore, CA 94550
Issue Date:
Research Org.:
Sandia National Laboratories (SNL), Albuquerque, NM, and Livermore, CA (United States)
OSTI Identifier:
872930
Patent Number(s):
6043106
Assignee:
Mescher, Mark J. (5640 Hobart St., Apt. #9, Pittsburg, PA 15217);James, Ralph B. (5420 Lenore Ave., Livermore, CA 94550);Schlesinger, Tuviah E. (8 Carleton Dr., Mount Lebanon, PA 15243);Hermon, Haim (3707 Carrigan Common, Livermore, CA 94550)
Patent Classifications (CPCs):
H - ELECTRICITY H01 - BASIC ELECTRIC ELEMENTS H01L - SEMICONDUCTOR DEVICES
DOE Contract Number:  
AC04-94AL85000
Resource Type:
Patent
Country of Publication:
United States
Language:
English
Subject:
method; surface; passivation; protection; cadmium; zinc; telluride; crystals; reducing; leakage; current; czt; particularly; cd; 1-x; zn; equal; zero; preferably; enhancing; ability; crystal; spectrally; resolve; radiological; emissions; wide; variety; radionuclides; processes; disclosed; provides; depositing; via; reactive; sputtering; silicon; nitride; hard-coat; overlayer; significant; reduction; currents; enhances; oxidizing; oxygen; plasma; prior; deposition; breaking; vacuum; reactive sputtering; surface passivation; leakage currents; surface leakage; significant reduction; silicon nitride; wide variety; method provides; cadmium zinc; leakage current; method provide; oxygen plasma; zinc telluride; czt crystal; telluride crystal; surface pass; /438/

Citation Formats

Mescher, Mark J, James, Ralph B, Schlesinger, Tuviah E, and Hermon, Haim. Method for surface passivation and protection of cadmium zinc telluride crystals. United States: N. p., 2000. Web.
Mescher, Mark J, James, Ralph B, Schlesinger, Tuviah E, & Hermon, Haim. Method for surface passivation and protection of cadmium zinc telluride crystals. United States.
Mescher, Mark J, James, Ralph B, Schlesinger, Tuviah E, and Hermon, Haim. Sat . "Method for surface passivation and protection of cadmium zinc telluride crystals". United States. https://www.osti.gov/servlets/purl/872930.
@article{osti_872930,
title = {Method for surface passivation and protection of cadmium zinc telluride crystals},
author = {Mescher, Mark J and James, Ralph B and Schlesinger, Tuviah E and Hermon, Haim},
abstractNote = {A method for reducing the leakage current in CZT crystals, particularly Cd.sub.1-x Zn.sub.x Te crystals (where x is greater than equal to zero and less than or equal to 0.5), and preferably Cd.sub.0.9 Zn.sub.0.1 Te crystals, thereby enhancing the ability of these crystal to spectrally resolve radiological emissions from a wide variety of radionuclides. Two processes are disclosed. The first method provides for depositing, via reactive sputtering, a silicon nitride hard-coat overlayer which provides significant reduction in surface leakage currents. The second method enhances the passivation by oxidizing the CZT surface with an oxygen plasma prior to silicon nitride deposition without breaking the vacuum state.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {Sat Jan 01 00:00:00 EST 2000},
month = {Sat Jan 01 00:00:00 EST 2000}
}

Works referenced in this record:

Performance of CdZnTe coplanar-grid gamma-ray detectors
journal, June 1996


Low‐temperature photoluminescence of detector grade Cd 1− x Zn x Te crystal treated by different chemical etchants
journal, September 1996


Investigation of electrical contacts for Cd/sub 1-x/Zn/sub x/Te nuclear radiation detector
journal, June 1997


Stress Control in Sputtered Silicon Nitride Films
journal, January 1997


Study of oxidized cadmium zinc telluride surfaces
journal, May 1997