Transmission electron microscope CCD camera
Abstract
In order to improve the performance of a CCD camera on a high voltage electron microscope, an electron decelerator is inserted between the microscope column and the CCD. This arrangement optimizes the interaction of the electron beam with the scintillator of the CCD camera while retaining optimization of the microscope optics and of the interaction of the beam with the specimen. Changing the electron beam energy between the specimen and camera allows both to be optimized.
- Inventors:
-
- Lafayette, CA
- Issue Date:
- Research Org.:
- Lawrence Berkeley National Laboratory (LBNL), Berkeley, CA (United States)
- OSTI Identifier:
- 872737
- Patent Number(s):
- 5998790
- Assignee:
- Regents of University of California (Oakland, CA)
- Patent Classifications (CPCs):
-
H - ELECTRICITY H01 - BASIC ELECTRIC ELEMENTS H01J - ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- DOE Contract Number:
- AC03-76SF00098
- Resource Type:
- Patent
- Country of Publication:
- United States
- Language:
- English
- Subject:
- transmission; electron; microscope; ccd; camera; improve; performance; voltage; decelerator; inserted; column; arrangement; optimizes; interaction; beam; scintillator; retaining; optimization; optics; specimen; changing; energy; allows; optimized; ccd camera; electron microscope; electron beam; beam energy; transmission electron; voltage electron; /250/
Citation Formats
Downing, Kenneth H. Transmission electron microscope CCD camera. United States: N. p., 1999.
Web.
Downing, Kenneth H. Transmission electron microscope CCD camera. United States.
Downing, Kenneth H. Fri .
"Transmission electron microscope CCD camera". United States. https://www.osti.gov/servlets/purl/872737.
@article{osti_872737,
title = {Transmission electron microscope CCD camera},
author = {Downing, Kenneth H},
abstractNote = {In order to improve the performance of a CCD camera on a high voltage electron microscope, an electron decelerator is inserted between the microscope column and the CCD. This arrangement optimizes the interaction of the electron beam with the scintillator of the CCD camera while retaining optimization of the microscope optics and of the interaction of the beam with the specimen. Changing the electron beam energy between the specimen and camera allows both to be optimized.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {Fri Jan 01 00:00:00 EST 1999},
month = {Fri Jan 01 00:00:00 EST 1999}
}
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