Beam characterization by wavefront sensor
Abstract
An apparatus and method for characterizing an energy beam (such as a laser) with a two-dimensional wavefront sensor, such as a Shack-Hartmann lenslet array. The sensor measures wavefront slope and irradiance of the beam at a single point on the beam and calculates a space-beamwidth product. A detector array such as a charge coupled device camera is preferably employed.
- Inventors:
-
- 17 Eric Alan Lane, Tijeras, NM 87059
- 3455 Tahoe, N.E., Albuquerque, NM 87111
- 9407 Shoehone, N.E., Albuquerque, NM 87111
- Issue Date:
- Research Org.:
- Sandia National Laboratories (SNL), Albuquerque, NM, and Livermore, CA (United States)
- OSTI Identifier:
- 872444
- Patent Number(s):
- 5936720
- Assignee:
- Neal, Daniel R. (17 Eric Alan Lane, Tijeras, NM 87059);Alford, W. J. (3455 Tahoe, N.E., Albuquerque, NM 87111);Gruetzner, James K. (9407 Shoehone, N.E., Albuquerque, NM 87111)
- Patent Classifications (CPCs):
-
G - PHYSICS G01 - MEASURING G01J - MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT
G - PHYSICS G02 - OPTICS G02B - OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS
- DOE Contract Number:
- AC04-94AL85000
- Resource Type:
- Patent
- Country of Publication:
- United States
- Language:
- English
- Subject:
- beam; characterization; wavefront; sensor; apparatus; method; characterizing; energy; laser; two-dimensional; shack-hartmann; lenslet; array; measures; slope; irradiance; single; calculates; space-beamwidth; product; detector; charge; coupled; device; camera; preferably; employed; energy beam; sensor measures; wavefront sensor; charge coupled; coupled device; detector array; device camera; lenslet array; /356/250/
Citation Formats
Neal, Daniel R, Alford, W J, and Gruetzner, James K. Beam characterization by wavefront sensor. United States: N. p., 1999.
Web.
Neal, Daniel R, Alford, W J, & Gruetzner, James K. Beam characterization by wavefront sensor. United States.
Neal, Daniel R, Alford, W J, and Gruetzner, James K. Fri .
"Beam characterization by wavefront sensor". United States. https://www.osti.gov/servlets/purl/872444.
@article{osti_872444,
title = {Beam characterization by wavefront sensor},
author = {Neal, Daniel R and Alford, W J and Gruetzner, James K},
abstractNote = {An apparatus and method for characterizing an energy beam (such as a laser) with a two-dimensional wavefront sensor, such as a Shack-Hartmann lenslet array. The sensor measures wavefront slope and irradiance of the beam at a single point on the beam and calculates a space-beamwidth product. A detector array such as a charge coupled device camera is preferably employed.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {Fri Jan 01 00:00:00 EST 1999},
month = {Fri Jan 01 00:00:00 EST 1999}
}
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