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Title: Beam characterization by wavefront sensor

Abstract

An apparatus and method for characterizing an energy beam (such as a laser) with a two-dimensional wavefront sensor, such as a Shack-Hartmann lenslet array. The sensor measures wavefront slope and irradiance of the beam at a single point on the beam and calculates a space-beamwidth product. A detector array such as a charge coupled device camera is preferably employed.

Inventors:
 [1];  [2];  [3]
  1. 17 Eric Alan Lane, Tijeras, NM 87059
  2. 3455 Tahoe, N.E., Albuquerque, NM 87111
  3. 9407 Shoehone, N.E., Albuquerque, NM 87111
Issue Date:
Research Org.:
Sandia National Laboratories (SNL), Albuquerque, NM, and Livermore, CA (United States)
OSTI Identifier:
872444
Patent Number(s):
5936720
Assignee:
Neal, Daniel R. (17 Eric Alan Lane, Tijeras, NM 87059);Alford, W. J. (3455 Tahoe, N.E., Albuquerque, NM 87111);Gruetzner, James K. (9407 Shoehone, N.E., Albuquerque, NM 87111)
Patent Classifications (CPCs):
G - PHYSICS G02 - OPTICS G02B - OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS
G - PHYSICS G01 - MEASURING G01J - MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT
DOE Contract Number:  
AC04-94AL85000
Resource Type:
Patent
Country of Publication:
United States
Language:
English
Subject:
beam; characterization; wavefront; sensor; apparatus; method; characterizing; energy; laser; two-dimensional; shack-hartmann; lenslet; array; measures; slope; irradiance; single; calculates; space-beamwidth; product; detector; charge; coupled; device; camera; preferably; employed; energy beam; sensor measures; wavefront sensor; charge coupled; coupled device; detector array; device camera; lenslet array; /356/250/

Citation Formats

Neal, Daniel R, Alford, W J, and Gruetzner, James K. Beam characterization by wavefront sensor. United States: N. p., 1999. Web.
Neal, Daniel R, Alford, W J, & Gruetzner, James K. Beam characterization by wavefront sensor. United States.
Neal, Daniel R, Alford, W J, and Gruetzner, James K. Fri . "Beam characterization by wavefront sensor". United States. https://www.osti.gov/servlets/purl/872444.
@article{osti_872444,
title = {Beam characterization by wavefront sensor},
author = {Neal, Daniel R and Alford, W J and Gruetzner, James K},
abstractNote = {An apparatus and method for characterizing an energy beam (such as a laser) with a two-dimensional wavefront sensor, such as a Shack-Hartmann lenslet array. The sensor measures wavefront slope and irradiance of the beam at a single point on the beam and calculates a space-beamwidth product. A detector array such as a charge coupled device camera is preferably employed.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {1999},
month = {1}
}

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