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Title: Method for imaging liquid and dielectric materials with scanning polarization force microscopy

Abstract

The invention images dielectric polarization forces on surfaces induced by a charged scanning force microscope (SFM) probe tip. On insulators, the major contribution to the surface polarizability at low frequencies is from surface ions. The mobility of these ions depends strongly on the humidity. Using the inventive SFM, liquid films, droplets, and other weakly adsorbed materials have been imaged.

Inventors:
 [1];  [2];  [2];  [3]
  1. Berkeley, CA
  2. El Cerrito, CA
  3. Kowloon, CN
Issue Date:
Research Org.:
Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States)
OSTI Identifier:
872181
Patent Number(s):
5880360
Assignee:
Regents, University of California (Oakland, CA)
Patent Classifications (CPCs):
G - PHYSICS G01 - MEASURING G01Q - SCANNING-PROBE TECHNIQUES OR APPARATUS
Y - NEW / CROSS SECTIONAL TECHNOLOGIES Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC Y10S - TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
DOE Contract Number:  
AC03-76SF00098
Resource Type:
Patent
Country of Publication:
United States
Language:
English
Subject:
method; imaging; liquid; dielectric; materials; scanning; polarization; force; microscopy; images; forces; surfaces; induced; charged; microscope; sfm; probe; tip; insulators; major; contribution; surface; polarizability; frequencies; mobility; depends; strongly; humidity; inventive; films; droplets; weakly; adsorbed; imaged; liquid film; bed material; dielectric materials; probe tip; dielectric material; force microscope; force microscopy; scanning polarization; scanning force; charged scanning; liquid films; surfaces induced; images dielectric; imaging liquid; polarization forces; polarization force; dielectric polarization; /73/250/

Citation Formats

Hu, Jun, Ogletree, D Frank, Salmeron, Miguel, and Xiao, Xudong. Method for imaging liquid and dielectric materials with scanning polarization force microscopy. United States: N. p., 1999. Web.
Hu, Jun, Ogletree, D Frank, Salmeron, Miguel, & Xiao, Xudong. Method for imaging liquid and dielectric materials with scanning polarization force microscopy. United States.
Hu, Jun, Ogletree, D Frank, Salmeron, Miguel, and Xiao, Xudong. Fri . "Method for imaging liquid and dielectric materials with scanning polarization force microscopy". United States. https://www.osti.gov/servlets/purl/872181.
@article{osti_872181,
title = {Method for imaging liquid and dielectric materials with scanning polarization force microscopy},
author = {Hu, Jun and Ogletree, D Frank and Salmeron, Miguel and Xiao, Xudong},
abstractNote = {The invention images dielectric polarization forces on surfaces induced by a charged scanning force microscope (SFM) probe tip. On insulators, the major contribution to the surface polarizability at low frequencies is from surface ions. The mobility of these ions depends strongly on the humidity. Using the inventive SFM, liquid films, droplets, and other weakly adsorbed materials have been imaged.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {1999},
month = {1}
}

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