Process for forming silicon carbide films and microcomponents
Abstract
Silicon carbide films and microcomponents are grown on silicon substrates at surface temperatures between 900 K and 1700 K via C.sub.60 precursors in a hydrogen-free environment. Selective crystalline silicon carbide growth can be achieved on patterned silicon-silicon oxide samples. Patterned SiC films are produced by making use of the high reaction probability of C.sub.60 with silicon at surface temperatures greater than 900 K and the negligible reaction probability for C.sub.60 on silicon dioxide at surface temperatures less than 1250 K.
- Inventors:
-
- Livermore, CA
- Berkeley, CA
- Issue Date:
- Research Org.:
- Lawrence Livermore National Laboratory (LLNL), Livermore, CA (United States)
- OSTI Identifier:
- 872105
- Patent Number(s):
- 5861346
- Assignee:
- Regents of University of California (Oakland, CA)
- Patent Classifications (CPCs):
-
C - CHEMISTRY C30 - CRYSTAL GROWTH C30B - SINGLE-CRYSTAL-GROWTH
Y - NEW / CROSS SECTIONAL TECHNOLOGIES Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC Y10S - TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- DOE Contract Number:
- W-7405-ENG-48
- Resource Type:
- Patent
- Country of Publication:
- United States
- Language:
- English
- Subject:
- process; forming; silicon; carbide; films; microcomponents; grown; substrates; surface; temperatures; 900; 1700; via; 60; precursors; hydrogen-free; environment; selective; crystalline; growth; achieved; patterned; silicon-silicon; oxide; samples; sic; produced; reaction; probability; negligible; dioxide; 1250; silicon substrates; silicon carbide; silicon substrate; silicon oxide; crystalline silicon; silicon dioxide; surface temperature; surface temperatures; selective crystalline; patterned silicon; forming silicon; carbide films; /438/117/427/
Citation Formats
Hamza, Alex V, Balooch, Mehdi, and Moalem, Mehran. Process for forming silicon carbide films and microcomponents. United States: N. p., 1999.
Web.
Hamza, Alex V, Balooch, Mehdi, & Moalem, Mehran. Process for forming silicon carbide films and microcomponents. United States.
Hamza, Alex V, Balooch, Mehdi, and Moalem, Mehran. Fri .
"Process for forming silicon carbide films and microcomponents". United States. https://www.osti.gov/servlets/purl/872105.
@article{osti_872105,
title = {Process for forming silicon carbide films and microcomponents},
author = {Hamza, Alex V and Balooch, Mehdi and Moalem, Mehran},
abstractNote = {Silicon carbide films and microcomponents are grown on silicon substrates at surface temperatures between 900 K and 1700 K via C.sub.60 precursors in a hydrogen-free environment. Selective crystalline silicon carbide growth can be achieved on patterned silicon-silicon oxide samples. Patterned SiC films are produced by making use of the high reaction probability of C.sub.60 with silicon at surface temperatures greater than 900 K and the negligible reaction probability for C.sub.60 on silicon dioxide at surface temperatures less than 1250 K.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {1999},
month = {1}
}
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