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Title: Method and apparatus for calibrating a particle emissions monitor

The instant invention discloses method and apparatus for calibrating particulate emissions monitors, in particular, and sampling probes, in general, without removing the instrument from the system being monitored. A source of one or more specific metals in aerosol (either solid or liquid) or vapor form is housed in the instrument. The calibration operation is initiated by moving a focusing lens, used to focus a light beam onto an analysis location and collect the output light response, from an operating position to a calibration position such that the focal point of the focusing lens is now within a calibration stream issuing from a calibration source. The output light response from the calibration stream can be compared to that derived from an analysis location in the operating position to more accurately monitor emissions within the emissions flow stream.
Inventors:
 [1];  [2]
  1. (Livermore, CA)
  2. (Tracy, CA)
Issue Date:
OSTI Identifier:
871694
Assignee:
Sandia Corporation (Livermore, CA) SNL
Patent Number(s):
US 5777734
Application Number:
08/585,341
Contract Number:
AC04-94AL85000
Research Org:
SANDIA CORP
Country of Publication:
United States
Language:
English
Subject:
method; apparatus; calibrating; particle; emissions; monitor; instant; discloses; particulate; monitors; particular; sampling; probes; removing; instrument; monitored; source; specific; metals; aerosol; solid; liquid; vapor; form; housed; calibration; operation; initiated; moving; focusing; lens; focus; light; beam; analysis; location; collect; output; response; operating; position; focal; stream; issuing; compared; derived; accurately; flow; output light; particulate emissions; focusing lens; light beam; flow stream; sampling probe; operating position; vapor form; analysis location; particle emissions; particulate emission; specific metal; /356/