skip to main content
DOE Patents title logo U.S. Department of Energy
Office of Scientific and Technical Information

Title: Method for reduction of selected ion intensities in confined ion beams

Abstract

A method for producing an ion beam having an increased proportion of analyte ions compared to carrier gas ions is disclosed. Specifically, the method has the step of addition of a charge transfer gas to the carrier analyte combination that accepts charge from the carrier gas ions yet minimally accepts charge from the analyte ions thereby selectively neutralizing the carrier gas ions. Also disclosed is the method as employed in various analytical instruments including an inductively coupled plasma mass spectrometer.

Inventors:
 [1];  [1];  [1]
  1. (Richland, WA)
Issue Date:
Research Org.:
Pacific Northwest National Laboratory (PNNL), Richland, WA
OSTI Identifier:
871633
Patent Number(s):
5767512
Assignee:
Battelle Memorial Institute (Richland, WA) PNNL
DOE Contract Number:  
AC06-76RL01830
Resource Type:
Patent
Country of Publication:
United States
Language:
English
Subject:
method; reduction; selected; intensities; confined; beams; producing; beam; increased; proportion; analyte; compared; carrier; gas; disclosed; specifically; step; addition; charge; transfer; combination; accepts; minimally; selectively; neutralizing; employed; various; analytical; instruments; including; inductively; coupled; plasma; mass; spectrometer; analytical instruments; transfer gas; inductively coupled; mass spectrometer; carrier gas; coupled plasma; charge transfer; selectively neutralizing; analytical instrument; increased proportion; /250/

Citation Formats

Eiden, Gregory C., Barinaga, Charles J., and Koppenaal, David W. Method for reduction of selected ion intensities in confined ion beams. United States: N. p., 1998. Web.
Eiden, Gregory C., Barinaga, Charles J., & Koppenaal, David W. Method for reduction of selected ion intensities in confined ion beams. United States.
Eiden, Gregory C., Barinaga, Charles J., and Koppenaal, David W. Thu . "Method for reduction of selected ion intensities in confined ion beams". United States. https://www.osti.gov/servlets/purl/871633.
@article{osti_871633,
title = {Method for reduction of selected ion intensities in confined ion beams},
author = {Eiden, Gregory C. and Barinaga, Charles J. and Koppenaal, David W.},
abstractNote = {A method for producing an ion beam having an increased proportion of analyte ions compared to carrier gas ions is disclosed. Specifically, the method has the step of addition of a charge transfer gas to the carrier analyte combination that accepts charge from the carrier gas ions yet minimally accepts charge from the analyte ions thereby selectively neutralizing the carrier gas ions. Also disclosed is the method as employed in various analytical instruments including an inductively coupled plasma mass spectrometer.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {1998},
month = {1}
}

Patent:

Save / Share: