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Title: Method for reduction of selected ion intensities in confined ion beams

Abstract

A method for producing an ion beam having an increased proportion of analyte ions compared to carrier gas ions is disclosed. Specifically, the method has the step of addition of a charge transfer gas to the carrier analyte combination that accepts charge from the carrier gas ions yet minimally accepts charge from the analyte ions thereby selectively neutralizing the carrier gas ions. Also disclosed is the method as employed in various analytical instruments including an inductively coupled plasma mass spectrometer.

Inventors:
 [1];  [1];  [1]
  1. Richland, WA
Issue Date:
Research Org.:
Pacific Northwest National Lab. (PNNL), Richland, WA (United States)
OSTI Identifier:
871633
Patent Number(s):
5767512
Assignee:
Battelle Memorial Institute (Richland, WA)
Patent Classifications (CPCs):
H - ELECTRICITY H01 - BASIC ELECTRIC ELEMENTS H01J - ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
DOE Contract Number:  
AC06-76RL01830
Resource Type:
Patent
Country of Publication:
United States
Language:
English
Subject:
method; reduction; selected; intensities; confined; beams; producing; beam; increased; proportion; analyte; compared; carrier; gas; disclosed; specifically; step; addition; charge; transfer; combination; accepts; minimally; selectively; neutralizing; employed; various; analytical; instruments; including; inductively; coupled; plasma; mass; spectrometer; analytical instruments; transfer gas; inductively coupled; mass spectrometer; carrier gas; coupled plasma; charge transfer; selectively neutralizing; analytical instrument; increased proportion; /250/

Citation Formats

Eiden, Gregory C, Barinaga, Charles J, and Koppenaal, David W. Method for reduction of selected ion intensities in confined ion beams. United States: N. p., 1998. Web.
Eiden, Gregory C, Barinaga, Charles J, & Koppenaal, David W. Method for reduction of selected ion intensities in confined ion beams. United States.
Eiden, Gregory C, Barinaga, Charles J, and Koppenaal, David W. Tue . "Method for reduction of selected ion intensities in confined ion beams". United States. https://www.osti.gov/servlets/purl/871633.
@article{osti_871633,
title = {Method for reduction of selected ion intensities in confined ion beams},
author = {Eiden, Gregory C and Barinaga, Charles J and Koppenaal, David W},
abstractNote = {A method for producing an ion beam having an increased proportion of analyte ions compared to carrier gas ions is disclosed. Specifically, the method has the step of addition of a charge transfer gas to the carrier analyte combination that accepts charge from the carrier gas ions yet minimally accepts charge from the analyte ions thereby selectively neutralizing the carrier gas ions. Also disclosed is the method as employed in various analytical instruments including an inductively coupled plasma mass spectrometer.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {1998},
month = {6}
}

Works referenced in this record:

Ion-trap mass spectrometry with an inductively coupled plasma source
journal, January 1994


Performance of an inductively coupled plasma source ion trap mass spectrometer
journal, January 1994


Use of nitrogen and hydrogen in inductively coupled plasma mass spectrometry
journal, January 1992


Dissociation of analyte oxide ions in inductively coupled plasma mass spectrometry
journal, January 1994


Effects of hydrogen mixed with argon carrier gas in electrothermal vaporization-inductively coupled plasma-mass spectrometry
journal, April 1992


Alternatives to all-argon plasmas in inductively coupled plasma mass spectrometry (ICP-MS): an overview
journal, January 1993


Fast atom bombardment of solids as an ion source in mass spectrometry
journal, September 1981


The role of desolvation and hydrogen addition on the excitation features of the inductively coupled plasma
journal, January 1988


Radio-frequency glow discharge ion trap mass spectrometry
journal, July 1992