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Title: Automated real-time detection of defects during machining of ceramics

Abstract

Apparatus for the automated real-time detection and classification of defects during the machining of ceramic components employs an elastic optical scattering technique using polarized laser light. A ceramic specimen is continuously moved while being machined. Polarized laser light is directed onto the ceramic specimen surface at a fixed position just aft of the machining tool for examination of the newly machined surface. Any foreign material near the location of the laser light on the ceramic specimen is cleared by an air blast. As the specimen is moved, its surface is continuously scanned by the polarized laser light beam to provide a two-dimensional image presented in real-time on a video display unit, with the motion of the ceramic specimen synchronized with the data acquisition speed. By storing known "feature masks" representing various surface and sub-surface defects and comparing measured defects with the stored feature masks, detected defects may be automatically characterized. Using multiple detectors, various types of defects may be detected and classified.

Inventors:
 [1];  [2]
  1. Naperville, IL
  2. Westmont, IL
Issue Date:
Research Org.:
Argonne National Laboratory (ANL), Argonne, IL
OSTI Identifier:
871237
Patent Number(s):
5689332
Assignee:
University of Chicago (Chicago, IL)
DOE Contract Number:  
W-31109-ENG-38
Resource Type:
Patent
Country of Publication:
United States
Language:
English
Subject:
automated; real-time; detection; defects; machining; ceramics; apparatus; classification; ceramic; components; employs; elastic; optical; scattering; technique; polarized; laser; light; specimen; continuously; moved; machined; directed; surface; fixed; position; tool; examination; newly; foreign; material; near; location; cleared; air; blast; scanned; beam; provide; two-dimensional; image; video; display; unit; motion; synchronized; data; acquisition; speed; storing; feature; masks; representing; various; sub-surface; comparing; measured; stored; detected; automatically; characterized; multiple; detectors; types; classified; surface defects; ceramic components; ceramic component; data acquisition; light beam; laser light; various types; fixed position; polarized laser; video display; real-time detection; two-dimensional image; optical scattering; display unit; ceramic specimen; foreign material; dimensional image; scattering technique; various surface; air blast; automated real-time; machined surface; machining tool; /356/250/

Citation Formats

Ellingson, William A, and Sun, Jiangang. Automated real-time detection of defects during machining of ceramics. United States: N. p., 1997. Web.
Ellingson, William A, & Sun, Jiangang. Automated real-time detection of defects during machining of ceramics. United States.
Ellingson, William A, and Sun, Jiangang. Wed . "Automated real-time detection of defects during machining of ceramics". United States. https://www.osti.gov/servlets/purl/871237.
@article{osti_871237,
title = {Automated real-time detection of defects during machining of ceramics},
author = {Ellingson, William A and Sun, Jiangang},
abstractNote = {Apparatus for the automated real-time detection and classification of defects during the machining of ceramic components employs an elastic optical scattering technique using polarized laser light. A ceramic specimen is continuously moved while being machined. Polarized laser light is directed onto the ceramic specimen surface at a fixed position just aft of the machining tool for examination of the newly machined surface. Any foreign material near the location of the laser light on the ceramic specimen is cleared by an air blast. As the specimen is moved, its surface is continuously scanned by the polarized laser light beam to provide a two-dimensional image presented in real-time on a video display unit, with the motion of the ceramic specimen synchronized with the data acquisition speed. By storing known "feature masks" representing various surface and sub-surface defects and comparing measured defects with the stored feature masks, detected defects may be automatically characterized. Using multiple detectors, various types of defects may be detected and classified.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {1997},
month = {1}
}

Patent:

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