Photodetectors using III-V nitrides
Abstract
A photodetector using a III-V nitride and having predetermined electrical properties is disclosed. The photodetector includes a substrate with interdigitated electrodes formed on its surface. The substrate has a sapphire base layer, a buffer layer formed from a III-V nitride and a single crystal III-V nitride film. The three layers are formed by electron cyclotron resonance microwave plasma-assisted molecular beam epitaxy (ECR-assisted MBE). Use of the ECR-assisted MBE process allows control and predetermination of the electrical properties of the photodetector.
- Inventors:
- Issue Date:
- Research Org.:
- Boston Univ., MA (United States)
- Sponsoring Org.:
- USDOE
- OSTI Identifier:
- 871184
- Patent Number(s):
- 5677538
- Application Number:
- 08/499,710
- Assignee:
- Trustees of Boston University (Boston, MA)
- Patent Classifications (CPCs):
-
H - ELECTRICITY H01 - BASIC ELECTRIC ELEMENTS H01L - SEMICONDUCTOR DEVICES
Y - NEW / CROSS SECTIONAL TECHNOLOGIES Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE Y02E - REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- DOE Contract Number:
- FG02-94ER81843
- Resource Type:
- Patent
- Resource Relation:
- Patent File Date: 1995 Jul 07
- Country of Publication:
- United States
- Language:
- English
- Subject:
- /250/
Citation Formats
Moustakas, Theodore D., and Misra, Mira. Photodetectors using III-V nitrides. United States: N. p., 1997.
Web.
Moustakas, Theodore D., & Misra, Mira. Photodetectors using III-V nitrides. United States.
Moustakas, Theodore D., and Misra, Mira. Wed .
"Photodetectors using III-V nitrides". United States. https://www.osti.gov/servlets/purl/871184.
@article{osti_871184,
title = {Photodetectors using III-V nitrides},
author = {Moustakas, Theodore D. and Misra, Mira},
abstractNote = {A photodetector using a III-V nitride and having predetermined electrical properties is disclosed. The photodetector includes a substrate with interdigitated electrodes formed on its surface. The substrate has a sapphire base layer, a buffer layer formed from a III-V nitride and a single crystal III-V nitride film. The three layers are formed by electron cyclotron resonance microwave plasma-assisted molecular beam epitaxy (ECR-assisted MBE). Use of the ECR-assisted MBE process allows control and predetermination of the electrical properties of the photodetector.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {1997},
month = {1}
}
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