System level latchup mitigation for single event and transient radiation effects on electronics

Kimbrough, Joseph Robert; Colella, Nicholas John

Title: System level latchup mitigation for single event and transient radiation effects on electronics

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Abstract

A "blink" technique, analogous to a person blinking at a flash of bright light, is provided for mitigating the effects of single event current latchup and prompt pulse destructive radiation on a micro-electronic circuit. The system includes event detection circuitry, power dump logic circuitry, and energy limiting measures with autonomous recovery. The event detection circuitry includes ionizing radiation pulse detection means for detecting a pulse of ionizing radiation and for providing at an output terminal thereof a detection signal indicative of the detection of a pulse of ionizing radiation. The current sensing circuitry is coupled to the power bus for determining an occurrence of excess current through the power bus caused by ionizing radiation or by ion-induced destructive latchup of a semiconductor device. The power dump circuitry includes power dump logic circuitry having a first input terminal connected to the output terminal of the ionizing radiation pulse detection circuitry and having a second input terminal connected to the output terminal of the current sensing circuitry. The power dump logic circuitry provides an output signal to the input terminal of the circuitry for opening the power bus and the circuitry for shorting the power bus to a ground potential to removemore » « less

Inventors:

Kimbrough, Joseph Robert ^[1]; Colella, Nicholas John ^[2]

Pleasanton, CA
Livermore, CA

Issue Date:: 1997-01-01

Research Org.:: Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States)

OSTI Identifier:: 871162

Patent Number(s):: 5672918

Assignee:: United States of America as represented by United States (Washington, DC)

Patent Classifications (CPCs):: H - ELECTRICITY H02 - GENERATION H02H - EMERGENCY PROTECTIVE CIRCUIT ARRANGEMENTS

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H - ELECTRICITY H02 - GENERATION H02H - EMERGENCY PROTECTIVE CIRCUIT ARRANGEMENTS
H02H5/005 - {responsive to ionising radiation

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DOE Contract Number:: W-7405-ENG-48

Resource Type:: Patent

Country of Publication:: United States

Language:: English

Subject:: level; latchup; mitigation; single; event; transient; radiation; effects; electronics; blink; technique; analogous; person; blinking; flash; bright; light; provided; mitigating; current; prompt; pulse; destructive; micro-electronic; circuit; detection; circuitry; power; dump; logic; energy; limiting; measures; autonomous; recovery; ionizing; means; detecting; providing; output; terminal; signal; indicative; sensing; coupled; bus; determining; occurrence; excess; caused; ion-induced; semiconductor; device; input; connected; provides; shorting; ground; potential; remove; series; fet; shunt; self-contained; removal; protect; latched; components; enable; transparent; operation; elements; input terminal; logic circuitry; pulse detection; ground potential; detection means; electronic circuit; output terminal; output signal; semiconductor device; ionizing radiation; signal indicative; current sensing; detection circuitry; single event; logic circuit; radiation pulse; detection circuit; terminal connected; detection signal; excess cu; bright light; /307/250/340/361/

Citation Formats


                    Kimbrough, Joseph Robert, and Colella, Nicholas John. System level latchup mitigation for single event and transient radiation effects on electronics.  United States: N. p., 1997. 
        Web.

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                    Kimbrough, Joseph Robert, & Colella, Nicholas John. System level latchup mitigation for single event and transient radiation effects on electronics.  United States.

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                    Kimbrough, Joseph Robert, and Colella, Nicholas John. Wed .  
        "System level latchup mitigation for single event and transient radiation effects on electronics".  United States.  https://www.osti.gov/servlets/purl/871162.

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@article{osti_871162,

  title        = {System level latchup mitigation for single event and transient radiation effects on electronics},

  author       = {Kimbrough, Joseph Robert and Colella, Nicholas John},

  abstractNote = {A "blink" technique, analogous to a person blinking at a flash of bright light, is provided for mitigating the effects of single event current latchup and prompt pulse destructive radiation on a micro-electronic circuit. The system includes event detection circuitry, power dump logic circuitry, and energy limiting measures with autonomous recovery. The event detection circuitry includes ionizing radiation pulse detection means for detecting a pulse of ionizing radiation and for providing at an output terminal thereof a detection signal indicative of the detection of a pulse of ionizing radiation. The current sensing circuitry is coupled to the power bus for determining an occurrence of excess current through the power bus caused by ionizing radiation or by ion-induced destructive latchup of a semiconductor device. The power dump circuitry includes power dump logic circuitry having a first input terminal connected to the output terminal of the ionizing radiation pulse detection circuitry and having a second input terminal connected to the output terminal of the current sensing circuitry. The power dump logic circuitry provides an output signal to the input terminal of the circuitry for opening the power bus and the circuitry for shorting the power bus to a ground potential to remove power from the power bus. The energy limiting circuitry with autonomous recovery includes circuitry for opening the power bus and circuitry for shorting the power bus to a ground potential. The circuitry for opening the power bus and circuitry for shorting the power bus to a ground potential includes a series FET and a shunt FET. The invention provides for self-contained sensing for latchup, first removal of power to protect latched components, and autonomous recovery to enable transparent operation of other system elements.},

  doi          = {},

  journal      = {},
number       = ,

  volume       = ,

  place        = {United States},

  year         = {1997},

  month        = {1}

}

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