Global to push GA events into
skip to main content

Title: On-clip high frequency reliability and failure test structures

Self-stressing test structures for realistic high frequency reliability characterizations. An on-chip high frequency oscillator, controlled by DC signals from off-chip, provides a range of high frequency pulses to test structures. The test structures provide information with regard to a variety of reliability failure mechanisms, including hot-carriers, electromigration, and oxide breakdown. The system is normally integrated at the wafer level to predict the failure mechanisms of the production integrated circuits on the same wafer.
Inventors:
 [1];  [1]
  1. (Albuquerque, NM)
Issue Date:
OSTI Identifier:
870926
Assignee:
Sandia Corporation (Albuquerque, NM) SNL
Patent Number(s):
US 5625288
Contract Number:
AC04-76DP00789
Research Org:
AT & T CORP
Country of Publication:
United States
Language:
English
Subject:
on-clip; frequency; reliability; failure; structures; self-stressing; realistic; characterizations; on-chip; oscillator; controlled; dc; signals; off-chip; provides; range; pulses; provide; information; regard; variety; mechanisms; including; hot-carriers; electromigration; oxide; breakdown; normally; integrated; wafer; level; predict; production; circuits; integrated circuits; integrated circuit; provide information; frequency pulses; failure mechanisms; including hot; frequency reliability; frequency oscillator; frequency pulse; dc signal; /324/

Similar records in DOepatents and OSTI.GOV collections: