Strain-optic voltage monitor wherein strain causes a change in the optical absorption of a crystalline material
Abstract
A voltage monitor which uses the shift in absorption edge of crystalline material to measure strain resulting from electric field-induced deformation of piezoelectric or electrostrictive material, providing a simple and accurate means for measuring voltage applied either by direct contact with the crystalline material or by subjecting the material to an electric field.
- Inventors:
-
- Albuquerque, NM
- Issue Date:
- Research Org.:
- AT&T
- OSTI Identifier:
- 870786
- Patent Number(s):
- 5594240
- Assignee:
- United States of America as represented by United States (Washington, DC)
- Patent Classifications (CPCs):
-
G - PHYSICS G01 - MEASURING G01R - MEASURING ELECTRIC VARIABLES
- DOE Contract Number:
- AC04-76DP00789
- Resource Type:
- Patent
- Country of Publication:
- United States
- Language:
- English
- Subject:
- strain-optic; voltage; monitor; strain; causes; change; optical; absorption; crystalline; material; shift; edge; measure; resulting; electric; field-induced; deformation; piezoelectric; electrostrictive; providing; simple; accurate; means; measuring; applied; direct; contact; subjecting; field; voltage monitor; crystalline material; optical absorption; voltage applied; direct contact; electric field; absorption edge; measuring voltage; induced deformation; optic voltage; rate means; rate mean; accurate means; /250/324/359/
Citation Formats
Weiss, Jonathan D. Strain-optic voltage monitor wherein strain causes a change in the optical absorption of a crystalline material. United States: N. p., 1997.
Web.
Weiss, Jonathan D. Strain-optic voltage monitor wherein strain causes a change in the optical absorption of a crystalline material. United States.
Weiss, Jonathan D. Wed .
"Strain-optic voltage monitor wherein strain causes a change in the optical absorption of a crystalline material". United States. https://www.osti.gov/servlets/purl/870786.
@article{osti_870786,
title = {Strain-optic voltage monitor wherein strain causes a change in the optical absorption of a crystalline material},
author = {Weiss, Jonathan D},
abstractNote = {A voltage monitor which uses the shift in absorption edge of crystalline material to measure strain resulting from electric field-induced deformation of piezoelectric or electrostrictive material, providing a simple and accurate means for measuring voltage applied either by direct contact with the crystalline material or by subjecting the material to an electric field.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {1997},
month = {1}
}
Save to My Library
You must Sign In or Create an Account in order to save documents to your library.
Works referenced in this record:
Gallium arsenide as an optical strain gauge
journal, April 1996
- Weiss, Jonathan D.; Lopez, Salvador S.; Howard, Arnold J.
- Review of Scientific Instruments, Vol. 67, Issue 4