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Title: Strain-optic voltage monitor wherein strain causes a change in the optical absorption of a crystalline material

A voltage monitor which uses the shift in absorption edge of crystalline material to measure strain resulting from electric field-induced deformation of piezoelectric or electrostrictive material, providing a simple and accurate means for measuring voltage applied either by direct contact with the crystalline material or by subjecting the material to an electric field.
Inventors:
 [1]
  1. (Albuquerque, NM)
Issue Date:
OSTI Identifier:
870786
Assignee:
United States of America as represented by United States (Washington, DC) SNL
Patent Number(s):
US 5594240
Contract Number:
AC04-76DP00789
Research Org:
AT & T CORP
Country of Publication:
United States
Language:
English
Subject:
strain-optic; voltage; monitor; strain; causes; change; optical; absorption; crystalline; material; shift; edge; measure; resulting; electric; field-induced; deformation; piezoelectric; electrostrictive; providing; simple; accurate; means; measuring; applied; direct; contact; subjecting; field; voltage monitor; crystalline material; optical absorption; voltage applied; direct contact; electric field; absorption edge; measuring voltage; induced deformation; optic voltage; rate means; rate mean; accurate means; /250/324/359/

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