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Title: System for monitoring the growth of crystalline films on stationary substrates

Abstract

A system for monitoring the growth of crystalline films on stationary or rotating substrates includes a combination of some or all of the elements including a photodiode sensor for detecting the intensity of incoming light and converting it to a measurable current, a lens for focusing the RHEED pattern emanating from the phosphor screen onto the photodiode, an interference filter for filtering out light other than that which emanates from the phosphor screen, a current amplifier for amplifying and convening the current produced by the photodiode into a voltage, a computer for receiving the amplified photodiode current for RHEED data analysis, and a graphite impregnated triax cable for improving the signal to noise ratio obtained while sampling a stationary or rotating substrate. A rotating stage for supporting the substrate with diametrically positioned electron beam apertures and an optically encoded shaft can also be used to accommodate rotation of the substrate during measurement.

Inventors:
 [1]
  1. Lakewood, CO
Issue Date:
Research Org.:
Midwest Research Institute (Kansas City, MI)
Sponsoring Org.:
USDOE
OSTI Identifier:
870756
Patent Number(s):
5588995
Assignee:
Midwest Research Institute (Kansas City, MI)
Patent Classifications (CPCs):
C - CHEMISTRY C30 - CRYSTAL GROWTH C30B - SINGLE-CRYSTAL-GROWTH
Y - NEW / CROSS SECTIONAL TECHNOLOGIES Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC Y10T - TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
DOE Contract Number:  
AC02-83CH10093
Resource Type:
Patent
Country of Publication:
United States
Language:
English
Subject:
monitoring; growth; crystalline; films; stationary; substrates; rotating; combination; elements; including; photodiode; sensor; detecting; intensity; incoming; light; converting; measurable; current; lens; focusing; rheed; pattern; emanating; phosphor; screen; interference; filter; filtering; emanates; amplifier; amplifying; convening; produced; voltage; computer; receiving; amplified; data; analysis; graphite; impregnated; triax; cable; improving; signal; noise; ratio; obtained; sampling; substrate; stage; supporting; diametrically; positioned; electron; beam; apertures; optically; encoded; shaft; accommodate; rotation; measurement; rotating substrate; phosphor screen; current produced; data analysis; crystalline films; incoming light; interference filter; electron beam; elements including; noise ratio; current amplifier; rotating substrates; stationary substrates; photodiode sensor; /117/118/

Citation Formats

Sheldon, Peter. System for monitoring the growth of crystalline films on stationary substrates. United States: N. p., 1996. Web.
Sheldon, Peter. System for monitoring the growth of crystalline films on stationary substrates. United States.
Sheldon, Peter. Mon . "System for monitoring the growth of crystalline films on stationary substrates". United States. https://www.osti.gov/servlets/purl/870756.
@article{osti_870756,
title = {System for monitoring the growth of crystalline films on stationary substrates},
author = {Sheldon, Peter},
abstractNote = {A system for monitoring the growth of crystalline films on stationary or rotating substrates includes a combination of some or all of the elements including a photodiode sensor for detecting the intensity of incoming light and converting it to a measurable current, a lens for focusing the RHEED pattern emanating from the phosphor screen onto the photodiode, an interference filter for filtering out light other than that which emanates from the phosphor screen, a current amplifier for amplifying and convening the current produced by the photodiode into a voltage, a computer for receiving the amplified photodiode current for RHEED data analysis, and a graphite impregnated triax cable for improving the signal to noise ratio obtained while sampling a stationary or rotating substrate. A rotating stage for supporting the substrate with diametrically positioned electron beam apertures and an optically encoded shaft can also be used to accommodate rotation of the substrate during measurement.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {Mon Jan 01 00:00:00 EST 1996},
month = {Mon Jan 01 00:00:00 EST 1996}
}