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Title: Apparatus for controlling the scan width of a scanning laser beam

Abstract

Swept-wavelength lasers are often used in absorption spectroscopy applications. In experiments where high accuracy is required, it is desirable to continuously monitor and control the range of wavelengths scanned (the scan width). A system has been demonstrated whereby the scan width of a swept ring-dye laser, or semiconductor diode laser, can be measured and controlled in real-time with a resolution better than 0.1%. Scan linearity, or conformity to a nonlinear scan waveform, can be measured and controlled. The system of the invention consists of a Fabry-Perot interferometer, three CAMAC interface modules, and a microcomputer running a simple analysis and proportional-integral control algorithm. With additional modules, multiple lasers can be simultaneously controlled. The invention also includes an embodiment implemented on an ordinary PC with a multifunction plug-in board.

Inventors:
 [1]
  1. Livermore, CA
Issue Date:
Research Org.:
Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States)
OSTI Identifier:
870656
Patent Number(s):
5568255
Assignee:
United States of America as represented by United States (Washington, DC)
DOE Contract Number:  
W-7405-ENG-48
Resource Type:
Patent
Country of Publication:
United States
Language:
English
Subject:
apparatus; controlling; scan; width; scanning; laser; beam; swept-wavelength; lasers; absorption; spectroscopy; applications; experiments; accuracy; required; desirable; continuously; monitor; control; range; wavelengths; scanned; demonstrated; whereby; swept; ring-dye; semiconductor; diode; measured; controlled; real-time; resolution; linearity; conformity; nonlinear; waveform; consists; fabry-perot; interferometer; camac; interface; modules; microcomputer; running; simple; analysis; proportional-integral; algorithm; additional; multiple; simultaneously; embodiment; implemented; ordinary; pc; multifunction; plug-in; board; wavelength laser; fabry-perot interferometer; control algorithm; dye laser; laser beam; diode laser; semiconductor diode; scan line; scanning laser; multiple laser; interface module; absorption spectroscopy; spectroscopy applications; multiple lasers; wavelength lasers; continuously monitor; /356/372/

Citation Formats

Johnson, Gary W. Apparatus for controlling the scan width of a scanning laser beam. United States: N. p., 1996. Web.
Johnson, Gary W. Apparatus for controlling the scan width of a scanning laser beam. United States.
Johnson, Gary W. Mon . "Apparatus for controlling the scan width of a scanning laser beam". United States. https://www.osti.gov/servlets/purl/870656.
@article{osti_870656,
title = {Apparatus for controlling the scan width of a scanning laser beam},
author = {Johnson, Gary W},
abstractNote = {Swept-wavelength lasers are often used in absorption spectroscopy applications. In experiments where high accuracy is required, it is desirable to continuously monitor and control the range of wavelengths scanned (the scan width). A system has been demonstrated whereby the scan width of a swept ring-dye laser, or semiconductor diode laser, can be measured and controlled in real-time with a resolution better than 0.1%. Scan linearity, or conformity to a nonlinear scan waveform, can be measured and controlled. The system of the invention consists of a Fabry-Perot interferometer, three CAMAC interface modules, and a microcomputer running a simple analysis and proportional-integral control algorithm. With additional modules, multiple lasers can be simultaneously controlled. The invention also includes an embodiment implemented on an ordinary PC with a multifunction plug-in board.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {1996},
month = {1}
}

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