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Title: Retractable pin dual in-line package test clip

Abstract

This invention is a Dual In-Line Package (DIP) test clip for use when troubleshooting circuits containing DIP integrated circuits. This test clip is a significant improvement over existing DIP test clips in that it has retractable pins which will permit troubleshooting without risk of accidentally shorting adjacent pins together when moving probes to different pins on energized circuits or when the probe is accidentally bumped while taking measurements.

Inventors:
 [1];  [2]
  1. Washington, PA
  2. Jefferson Boro, PA
Issue Date:
OSTI Identifier:
870462
Patent Number(s):
5525812
Assignee:
United States of America as represented by United States (Washington, DC)
Resource Type:
Patent
Country of Publication:
United States
Language:
English
Subject:
retractable; dual; in-line; package; clip; dip; troubleshooting; circuits; containing; integrated; significant; improvement; existing; clips; pins; permit; risk; accidentally; shorting; adjacent; moving; probes; energized; probe; bumped; taking; measurements; integrated circuits; integrated circuit; significant improvement; in-line package; dual in-line; /257/29/422/

Citation Formats

Bandzuch, Gregory S, and Kosslow, William J. Retractable pin dual in-line package test clip. United States: N. p., 1996. Web.
Bandzuch, Gregory S, & Kosslow, William J. Retractable pin dual in-line package test clip. United States.
Bandzuch, Gregory S, and Kosslow, William J. Mon . "Retractable pin dual in-line package test clip". United States. https://www.osti.gov/servlets/purl/870462.
@article{osti_870462,
title = {Retractable pin dual in-line package test clip},
author = {Bandzuch, Gregory S and Kosslow, William J},
abstractNote = {This invention is a Dual In-Line Package (DIP) test clip for use when troubleshooting circuits containing DIP integrated circuits. This test clip is a significant improvement over existing DIP test clips in that it has retractable pins which will permit troubleshooting without risk of accidentally shorting adjacent pins together when moving probes to different pins on energized circuits or when the probe is accidentally bumped while taking measurements.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {1996},
month = {1}
}

Patent:

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