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Title: Elevated voltage level I.sub.DDQ failure testing of integrated circuits

Burn in testing of static CMOS IC's is eliminated by I.sub.DDQ testing at elevated voltage levels. These voltage levels are at least 25% higher than the normal operating voltage for the IC but are below voltage levels that would cause damage to the chip.
Inventors:
 [1]
  1. (Albuquerque, NM)
Issue Date:
OSTI Identifier:
870427
Assignee:
Sandia Corporation (Albuquerque, NM) SNL
Patent Number(s):
US 5519333
Contract Number:
AC04-94AL85000
Research Org:
SANDIA CORP
Country of Publication:
United States
Language:
English
Subject:
elevated; voltage; level; ddq; failure; testing; integrated; circuits; burn; static; cmos; eliminated; levels; 25; normal; operating; below; damage; chip; voltage levels; operating voltage; integrated circuits; integrated circuit; normal operating; voltage level; elevated voltage; /324/

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