Electron source for a mini ion trap mass spectrometer

Dietrich, Daniel D; Keville, Robert F

Advanced Search OptionsAdvanced Search queries use a traditional Term Search. For more info, see our FAQ.

All Fields:

Patent Title:

Abstract:

Assignee:

Inventor(s):

Patent Number:

Patent Classification (CPC):

All Classifications
A - human necessities
A01 - agriculture
A21 - baking
A22 - butchering
A23 - foods or foodstuffs
A24 - tobacco
A41 - wearing apparel
A42 - headwear
A43 - footwear
A44 - haberdashery
A45 - hand or travelling articles
A46 - brushware
A47 - furniture
A61 - medical or veterinary science
A62 - life-saving
A63 - sports
A99 - subject matter not otherwise provided for in this section
B - performing operations
B01 - physical or chemical processes or apparatus in general
B02 - crushing, pulverising, or disintegrating
B03 - separation of solid materials using liquids or using pneumatic tables or jigs
B04 - centrifugal apparatus or machines for carrying-out physical or chemical processes
B05 - spraying or atomising in general
B06 - generating or transmitting mechanical vibrations in general
B07 - separating solids from solids
B08 - cleaning
B09 - disposal of solid waste
B21 - mechanical metal-working without essentially removing material
B22 - casting
B23 - machine tools
B24 - grinding
B25 - hand tools
B26 - hand cutting tools
B27 - working or preserving wood or similar material
B28 - working cement, clay, or stone
B29 - working of plastics
B30 - presses
B31 - making articles of paper, cardboard or material worked in a manner analogous to paper
B32 - layered products
B33 - additive manufacturing technology
B41 - printing
B42 - bookbinding
B43 - writing or drawing implements
B44 - decorative arts
B60 - vehicles in general
B61 - railways
B62 - land vehicles for travelling otherwise than on rails
B63 - ships or other waterborne vessels
B64 - aircraft
B65 - conveying
B66 - hoisting
B67 - opening, closing {or cleaning} bottles, jars or similar containers
B68 - saddlery
B81 - microstructural technology
B82 - nanotechnology
B99 - subject matter not otherwise provided for in this section
C - chemistry
C01 - inorganic chemistry
C02 - treatment of water, waste water, sewage, or sludge
C03 - glass
C04 - cements
C05 - fertilisers
C06 - explosives
C07 - organic chemistry
C08 - organic macromolecular compounds
C09 - dyes
C10 - petroleum, gas or coke industries
C11 - animal or vegetable oils, fats, fatty substances or waxes
C12 - biochemistry
C13 - sugar industry
C14 - skins
C21 - metallurgy of iron
C22 - metallurgy
C23 - coating metallic material
C25 - electrolytic or electrophoretic processes
C30 - crystal growth
C40 - combinatorial technology
C99 - subject matter not otherwise provided for in this section
D - textiles
D01 - natural or man-made threads or fibres
D02 - yarns
D03 - weaving
D04 - braiding
D05 - sewing
D06 - treatment of textiles or the like
D07 - ropes
D10 - indexing scheme associated with sublasses of section d, relating to textiles
D21 - paper-making
D99 - subject matter not otherwise provided for in this section
E - fixed constructions
E01 - construction of roads, railways, or bridges
E02 - hydraulic engineering
E03 - water supply
E04 - building
E05 - locks
E06 - doors, windows, shutters, or roller blinds in general
E21 - earth drilling
E99 - subject matter not otherwise provided for in this section
F - mechanical engineering
F01 - machines or engines in general
F02 - combustion engines
F03 - machines or engines for liquids
F04 - positive - displacement machines for liquids
F05 - indexing schemes relating to engines or pumps in various subclasses of classes f01-f04
F15 - fluid-pressure actuators
F16 - engineering elements and units
F17 - storing or distributing gases or liquids
F21 - lighting
F22 - steam generation
F23 - combustion apparatus
F24 - heating
F25 - refrigeration or cooling
F26 - drying
F27 - furnaces
F28 - heat exchange in general
F41 - weapons
F42 - ammunition
F99 - subject matter not otherwise provided for in this section
G - physics
G01 - measuring
G02 - optics
G03 - photography
G04 - horology
G05 - controlling
G06 - computing
G07 - checking-devices
G08 - signalling
G09 - education
G10 - musical instruments
G11 - information storage
G12 - instrument details
G16 - information and communication technology [ict] specially adapted for specific application fields
G21 - nuclear physics
G99 - subject matter not otherwise provided for in this section
H - electricity
H01 - basic electric elements
H02 - generation
H03 - basic electronic circuitry
H04 - electric communication technique
H05 - electric techniques not otherwise provided for
H99 - subject matter not otherwise provided for in this section
Y - new / cross sectional technologies
Y02 - technologies or applications for mitigation or adaptation against climate change
Y04 - information or communication technologies having an impact on other technology areas
Y10 - technical subjects covered by former uspc

More Options ...

Title: Electron source for a mini ion trap mass spectrometer

Abstract

An ion trap which operates in the regime between research ion traps which can detect ions with a mass resolution of better than 1:10.sup.9 and commercial mass spectrometers requiring 10.sup.4 ions with resolutions of a few hundred. The power consumption is kept to a minimum by the use of permanent magnets and a novel electron gun design. By Fourier analyzing the ion cyclotron resonance signals induced in the trap electrodes, a complete mass spectra in a single combined structure can be detected. An attribute of the ion trap mass spectrometer is that overall system size is drastically reduced due to combining a unique electron source and mass analyzer/detector in a single device. This enables portable low power mass spectrometers for the detection of environmental pollutants or illicit substances, as well as sensors for on board diagnostics to monitor engine performance or for active feedback in any process involving exhausting waste products.

Inventors:

Dietrich, Daniel D ^[1]; Keville, Robert F ^[2]

Livermore, CA
Valley Springs, CA

Issue Date:: 1995-01-01

Research Org.:: Lawrence Livermore National Laboratory (LLNL), Livermore, CA (United States)

OSTI Identifier:: 870214

Patent Number(s):: 5477046

Assignee:: Regents of University of California ()

Patent Classifications (CPCs):: H - ELECTRICITY H01 - BASIC ELECTRIC ELEMENTS H01J - ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS

Show more

H - ELECTRICITY H01 - BASIC ELECTRIC ELEMENTS H01J - ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
H01J49/0013 - {Miniaturised spectrometers, e.g. having smaller than usual scale, integrated conventional components}
H01J49/08 - Electron sources, e.g. for generating photo-electrons, secondary electrons or Auger electrons
H01J49/38 - Omegatrons {Using ion cyclotron resonance}

Show less

DOE Contract Number:: W-7405-ENG-48

Resource Type:: Patent

Country of Publication:: United States

Language:: English

Subject:: electron; source; mini; trap; mass; spectrometer; operates; regime; traps; detect; resolution; 10; commercial; spectrometers; requiring; resolutions; hundred; power; consumption; kept; minimum; permanent; magnets; novel; gun; design; fourier; analyzing; cyclotron; resonance; signals; induced; electrodes; complete; spectra; single; combined; structure; detected; attribute; overall; size; drastically; reduced; due; combining; unique; analyzer; detector; device; enables; portable; detection; environmental; pollutants; illicit; substances; sensors; board; diagnostics; monitor; engine; performance; active; feedback; process; involving; exhausting; waste; products; active feedback; waste product; single device; electron source; mass spectrometers; power consumption; mass spectrometer; permanent magnet; permanent magnets; electron gun; cyclotron resonance; trap mass; process involving; mass analyzer; waste products; resonance signals; signals induced; single combined; mass resolution; spectrometers requiring; novel electron; commercial mass; environmental pollutants; environmental pollutant; /250/

Citation Formats


                    Dietrich, Daniel D, and Keville, Robert F. Electron source for a mini ion trap mass spectrometer.  United States: N. p., 1995. 
        Web.

Copy to clipboard


                    Dietrich, Daniel D, & Keville, Robert F. Electron source for a mini ion trap mass spectrometer.  United States.

Copy to clipboard


                    Dietrich, Daniel D, and Keville, Robert F. Sun .  
        "Electron source for a mini ion trap mass spectrometer".  United States.  https://www.osti.gov/servlets/purl/870214.

Copy to clipboard


                    
@article{osti_870214,

  title        = {Electron source for a mini ion trap mass spectrometer},

  author       = {Dietrich, Daniel D and Keville, Robert F},

  abstractNote = {An ion trap which operates in the regime between research ion traps which can detect ions with a mass resolution of better than 1:10.sup.9 and commercial mass spectrometers requiring 10.sup.4 ions with resolutions of a few hundred. The power consumption is kept to a minimum by the use of permanent magnets and a novel electron gun design. By Fourier analyzing the ion cyclotron resonance signals induced in the trap electrodes, a complete mass spectra in a single combined structure can be detected. An attribute of the ion trap mass spectrometer is that overall system size is drastically reduced due to combining a unique electron source and mass analyzer/detector in a single device. This enables portable low power mass spectrometers for the detection of environmental pollutants or illicit substances, as well as sensors for on board diagnostics to monitor engine performance or for active feedback in any process involving exhausting waste products.},

  doi          = {},

  journal      = {},
number       = ,

  volume       = ,

  place        = {United States},

  year         = {1995},

  month        = {1}

}

Copy to clipboard

Patent:

Save / Share:

Export Metadata

Save to My Library

Works referenced in this record:

Electron Emission from Thin Al‐Al ₂ O ₃ ‐Au Structures
journal, December 1962

Kanter, H.; Feibelman, W. A.
Journal of Applied Physics, Vol. 33, Issue 12
https://doi.org/10.1063/1.1702450

Operation of Tunnel‐Emission Devices
journal, April 1961

Mead, C. A.
Journal of Applied Physics, Vol. 32, Issue 4
https://doi.org/10.1063/1.1736064

Hot Electrons in Metal Films: Injection and Collection
journal, April 1961

Spratt, James P.; Schwarz, Ruth F.; Kane, Walter M.
Physical Review Letters, Vol. 6, Issue 7
https://doi.org/10.1103/PhysRevLett.6.341

Similar Records in DOE Patents and OSTI.GOV collections:

Mini ion trap mass spectrometer

Patent Dietrich, Daniel D [Livermore, CA]; Keville, Robert F [Valley Springs, CA]

An ion trap which operates in the regime between research ion traps which can detect ions with a mass resolution of better than 1:10.sup.9 and commercial mass spectrometers requiring 10.sup.4 ions with resolutions of a few hundred. The power consumption is kept to a minimum by the use of permanent magnets and a novel electron gun design. By Fourier analyzing the ion cyclotron resonance signals induced in the trap electrodes, a complete mass spectra in a single combined structure can be detected. An attribute of the ion trap mass spectrometer is that overall system size is drastically reduced due tomore » « less
Full Text Available
Electron source for a mini ion trap mass spectrometer

Patent Dietrich, D D; Keville, R F

An ion trap is described which operates in the regime between research ion traps which can detect ions with a mass resolution of better than 1:10{sup 9} and commercial mass spectrometers requiring 10{sup 4} ions with resolutions of a few hundred. The power consumption is kept to a minimum by the use of permanent magnets and a novel electron gun design. By Fourier analyzing the ion cyclotron resonance signals induced in the trap electrodes, a complete mass spectra in a single combined structure can be detected. An attribute of the ion trap mass spectrometer is that overall system size ismore » « less
Systems and methods for integrating ion mobility and ion trap mass spectrometers

Patent Ibrahim, Yehia M.; Garimella, Sandilya; Prost, Spencer A.

Described herein are examples of systems and methods for integrating IMS and MS systems. In certain examples, systems and methods for decoding double multiplexed data are described. The systems and methods can also perform multiple refining procedures in order to minimize the demultiplexing artifacts. The systems and methods can be used, for example, for the analysis of proteomic and petroleum samples, where the integration of IMS and high mass resolution are used for accurate assignment of molecular formulae.
Full Text Available
Differentially pumped dual linear quadrupole ion trap mass spectrometer

Patent Owen, Benjamin C.; Kenttamaa, Hilkka I.

The present disclosure provides a new tandem mass spectrometer and methods of using the same for analyzing charged particles. The differentially pumped dual linear quadrupole ion trap mass spectrometer of the present disclose includes a combination of two linear quadrupole (LQIT) mass spectrometers with differentially pumped vacuum chambers.
Full Text Available
Non-destructive ion trap mass spectrometer and method

Patent Frankevich, Vladimir E.; Soni, Manish H.; Nappi, Mario; ...

The invention relates to an ion trap mass spectrometer of the type having an ion trapping volume defined by spaced end caps and a ring electrode. The ion trap includes a small sensing electrode which senses characteristic motion of ions trapped in said trapping volume and provides an image current. Ions are excited into characteristic motion by application of an excitation pulse to the trapped ions. The invention also relates to a method of operating such an ion trap.
Full Text Available

Similar Records

Title: Electron source for a mini ion trap mass spectrometer

Abstract

Citation Formats

Electron Emission from Thin Al‐Al 2 O 3 ‐Au Structures journal, December 1962

Operation of Tunnel‐Emission Devices journal, April 1961

Hot Electrons in Metal Films: Injection and Collection journal, April 1961

Electron Emission from Thin Al‐Al ₂ O ₃ ‐Au Structures
journal, December 1962

Operation of Tunnel‐Emission Devices
journal, April 1961

Hot Electrons in Metal Films: Injection and Collection
journal, April 1961