Imaging, cutting, and collecting instrument and method
Abstract
Instrumentation and techniques to image small objects, such as but not limited to individual human chromosomes, with nanometer resolution, to cut-off identified parts of such objects, to move around and manipulate such cut-off parts on the substrate on which they are being imaged to predetermined locations on the substrate, and to remove the cut-off parts from the substrate. This is accomplished using an atomic force microscope (AFM) and by modification of the conventional cantilever stylus assembly of an AFM, such that plural cantilevers are used with either sharp-tips or knife-edges thereon. In addition, the invention can be utilized for measuring hardness of materials.
- Inventors:
-
- Tracy, CA
- Berkeley, CA
- Livermore, CA
- Davis, CA
- Issue Date:
- Research Org.:
- Lawrence Livermore National Laboratory (LLNL), Livermore, CA (United States)
- OSTI Identifier:
- 870133
- Patent Number(s):
- 5461907
- Assignee:
- Regents of University of California (Oakland, CA)
- Patent Classifications (CPCs):
-
G - PHYSICS G01 - MEASURING G01Q - SCANNING-PROBE TECHNIQUES OR APPARATUS
Y - NEW / CROSS SECTIONAL TECHNOLOGIES Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC Y10S - TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- DOE Contract Number:
- W-7405-ENG-48
- Resource Type:
- Patent
- Country of Publication:
- United States
- Language:
- English
- Subject:
- imaging; cutting; collecting; instrument; method; instrumentation; techniques; image; limited; individual; human; chromosomes; nanometer; resolution; cut-off; identified; move; manipulate; substrate; imaged; predetermined; locations; remove; accomplished; atomic; force; microscope; afm; modification; conventional; cantilever; stylus; assembly; plural; cantilevers; sharp-tips; knife-edges; thereon; addition; utilized; measuring; hardness; materials; predetermined location; atomic force; force microscope; predetermined locations; human chromosomes; /73/
Citation Formats
Tench, Robert J, Siekhaus, Wigbert J, Balooch, Mehdi, Balhorn, Rodney L, and Allen, Michael J. Imaging, cutting, and collecting instrument and method. United States: N. p., 1995.
Web.
Tench, Robert J, Siekhaus, Wigbert J, Balooch, Mehdi, Balhorn, Rodney L, & Allen, Michael J. Imaging, cutting, and collecting instrument and method. United States.
Tench, Robert J, Siekhaus, Wigbert J, Balooch, Mehdi, Balhorn, Rodney L, and Allen, Michael J. Sun .
"Imaging, cutting, and collecting instrument and method". United States. https://www.osti.gov/servlets/purl/870133.
@article{osti_870133,
title = {Imaging, cutting, and collecting instrument and method},
author = {Tench, Robert J and Siekhaus, Wigbert J and Balooch, Mehdi and Balhorn, Rodney L and Allen, Michael J},
abstractNote = {Instrumentation and techniques to image small objects, such as but not limited to individual human chromosomes, with nanometer resolution, to cut-off identified parts of such objects, to move around and manipulate such cut-off parts on the substrate on which they are being imaged to predetermined locations on the substrate, and to remove the cut-off parts from the substrate. This is accomplished using an atomic force microscope (AFM) and by modification of the conventional cantilever stylus assembly of an AFM, such that plural cantilevers are used with either sharp-tips or knife-edges thereon. In addition, the invention can be utilized for measuring hardness of materials.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {1995},
month = {1}
}
Save to My Library
You must Sign In or Create an Account in order to save documents to your library.