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Title: Imaging, cutting, and collecting instrument and method

Abstract

Instrumentation and techniques to image small objects, such as but not limited to individual human chromosomes, with nanometer resolution, to cut-off identified parts of such objects, to move around and manipulate such cut-off parts on the substrate on which they are being imaged to predetermined locations on the substrate, and to remove the cut-off parts from the substrate. This is accomplished using an atomic force microscope (AFM) and by modification of the conventional cantilever stylus assembly of an AFM, such that plural cantilevers are used with either sharp-tips or knife-edges thereon. In addition, the invention can be utilized for measuring hardness of materials.

Inventors:
 [1];  [2];  [2];  [3];  [4]
  1. (Tracy, CA)
  2. (Berkeley, CA)
  3. (Livermore, CA)
  4. (Davis, CA)
Issue Date:
Research Org.:
Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States)
OSTI Identifier:
870133
Patent Number(s):
5461907
Assignee:
Regents of University of California (Oakland, CA) LLNL
DOE Contract Number:  
W-7405-ENG-48
Resource Type:
Patent
Country of Publication:
United States
Language:
English
Subject:
imaging; cutting; collecting; instrument; method; instrumentation; techniques; image; limited; individual; human; chromosomes; nanometer; resolution; cut-off; identified; move; manipulate; substrate; imaged; predetermined; locations; remove; accomplished; atomic; force; microscope; afm; modification; conventional; cantilever; stylus; assembly; plural; cantilevers; sharp-tips; knife-edges; thereon; addition; utilized; measuring; hardness; materials; predetermined location; atomic force; force microscope; predetermined locations; human chromosomes; /73/

Citation Formats

Tench, Robert J., Siekhaus, Wigbert J., Balooch, Mehdi, Balhorn, Rodney L., and Allen, Michael J. Imaging, cutting, and collecting instrument and method. United States: N. p., 1995. Web.
Tench, Robert J., Siekhaus, Wigbert J., Balooch, Mehdi, Balhorn, Rodney L., & Allen, Michael J. Imaging, cutting, and collecting instrument and method. United States.
Tench, Robert J., Siekhaus, Wigbert J., Balooch, Mehdi, Balhorn, Rodney L., and Allen, Michael J. Sun . "Imaging, cutting, and collecting instrument and method". United States. https://www.osti.gov/servlets/purl/870133.
@article{osti_870133,
title = {Imaging, cutting, and collecting instrument and method},
author = {Tench, Robert J. and Siekhaus, Wigbert J. and Balooch, Mehdi and Balhorn, Rodney L. and Allen, Michael J.},
abstractNote = {Instrumentation and techniques to image small objects, such as but not limited to individual human chromosomes, with nanometer resolution, to cut-off identified parts of such objects, to move around and manipulate such cut-off parts on the substrate on which they are being imaged to predetermined locations on the substrate, and to remove the cut-off parts from the substrate. This is accomplished using an atomic force microscope (AFM) and by modification of the conventional cantilever stylus assembly of an AFM, such that plural cantilevers are used with either sharp-tips or knife-edges thereon. In addition, the invention can be utilized for measuring hardness of materials.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {1995},
month = {1}
}

Patent:

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