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Title: Emissivity corrected infrared method for imaging anomalous structural heat flows

Abstract

A method for detecting flaws in structures using dual band infrared radiation. Heat is applied to the structure being evaluated. The structure is scanned for two different wavelengths and data obtained in the form of images. Images are used to remove clutter to form a corrected image. The existence and nature of a flaw is determined by investigating a variety of features.

Inventors:
 [1];  [2];  [2];  [2]
  1. San Leandro, CA
  2. Livermore, CA
Issue Date:
Research Org.:
Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States)
OSTI Identifier:
870041
Patent Number(s):
5444241
Assignee:
Regents of University of California (Oakland, CA)
DOE Contract Number:  
W-7405-ENG-48
Resource Type:
Patent
Country of Publication:
United States
Language:
English
Subject:
emissivity; corrected; infrared; method; imaging; anomalous; structural; heat; flows; detecting; flaws; structures; dual; band; radiation; applied; structure; evaluated; scanned; wavelengths; data; obtained; form; images; remove; clutter; image; existence; nature; flaw; determined; investigating; variety; features; heat flow; infrared radiation; data obtained; detecting flaws; heat flows; /250/

Citation Formats

Del Grande, Nancy K, Durbin, Philip F, Dolan, Kenneth W, and Perkins, Dwight E. Emissivity corrected infrared method for imaging anomalous structural heat flows. United States: N. p., 1995. Web.
Del Grande, Nancy K, Durbin, Philip F, Dolan, Kenneth W, & Perkins, Dwight E. Emissivity corrected infrared method for imaging anomalous structural heat flows. United States.
Del Grande, Nancy K, Durbin, Philip F, Dolan, Kenneth W, and Perkins, Dwight E. Sun . "Emissivity corrected infrared method for imaging anomalous structural heat flows". United States. https://www.osti.gov/servlets/purl/870041.
@article{osti_870041,
title = {Emissivity corrected infrared method for imaging anomalous structural heat flows},
author = {Del Grande, Nancy K and Durbin, Philip F and Dolan, Kenneth W and Perkins, Dwight E},
abstractNote = {A method for detecting flaws in structures using dual band infrared radiation. Heat is applied to the structure being evaluated. The structure is scanned for two different wavelengths and data obtained in the form of images. Images are used to remove clutter to form a corrected image. The existence and nature of a flaw is determined by investigating a variety of features.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {1995},
month = {1}
}

Patent:

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