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Title: Emissivity corrected infrared method for imaging anomalous structural heat flows

A method for detecting flaws in structures using dual band infrared radiation. Heat is applied to the structure being evaluated. The structure is scanned for two different wavelengths and data obtained in the form of images. Images are used to remove clutter to form a corrected image. The existence and nature of a flaw is determined by investigating a variety of features.
 [1];  [2];  [2];  [2]
  1. (San Leandro, CA)
  2. (Livermore, CA)
Issue Date:
OSTI Identifier:
Regents of University of California (Oakland, CA) LLNL
Patent Number(s):
US 5444241
Contract Number:
Research Org:
Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States)
Country of Publication:
United States
emissivity; corrected; infrared; method; imaging; anomalous; structural; heat; flows; detecting; flaws; structures; dual; band; radiation; applied; structure; evaluated; scanned; wavelengths; data; obtained; form; images; remove; clutter; image; existence; nature; flaw; determined; investigating; variety; features; heat flow; infrared radiation; data obtained; detecting flaws; heat flows; /250/