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Title: Surface property detection apparatus and method

Abstract

Apparatus and method for detecting, determining, and imaging surface resistance corrosion, thin film growth, and oxide formation on the surface of conductors or other electrical surface modification. The invention comprises a modified confocal resonator structure with the sample remote from the radiating mirror. Surface resistance is determined by analyzing and imaging reflected microwaves; imaging reveals anomalies due to surface impurities, non-stoichiometry, and the like, in the surface of the superconductor, conductor, dielectric, or semiconductor.

Inventors:
 [1];  [2];  [3];  [1]
  1. Albuquerque, NM
  2. Evergreen, CO
  3. Placitas, NM
Issue Date:
Research Org.:
AT & T CORP
OSTI Identifier:
870017
Patent Number(s):
5440238
Assignee:
Sandia Corporation (Albuquerque, NM)
DOE Contract Number:  
AC04-76DP00789
Resource Type:
Patent
Country of Publication:
United States
Language:
English
Subject:
surface; property; detection; apparatus; method; detecting; determining; imaging; resistance; corrosion; film; growth; oxide; formation; conductors; electrical; modification; comprises; modified; confocal; resonator; structure; sample; remote; radiating; mirror; determined; analyzing; reflected; microwaves; reveals; anomalies; due; impurities; non-stoichiometry; superconductor; conductor; dielectric; semiconductor; surface resistance; detection apparatus; film growth; surface modification; resonator structure; surface impurities; imaging surface; sample remote; oxide form; reflected microwave; confocal resonator; /324/117/118/

Citation Formats

Martens, Jon S, Ginley, David S, Hietala, Vincent M, and Sorensen, Neil R. Surface property detection apparatus and method. United States: N. p., 1995. Web.
Martens, Jon S, Ginley, David S, Hietala, Vincent M, & Sorensen, Neil R. Surface property detection apparatus and method. United States.
Martens, Jon S, Ginley, David S, Hietala, Vincent M, and Sorensen, Neil R. Sun . "Surface property detection apparatus and method". United States. https://www.osti.gov/servlets/purl/870017.
@article{osti_870017,
title = {Surface property detection apparatus and method},
author = {Martens, Jon S and Ginley, David S and Hietala, Vincent M and Sorensen, Neil R},
abstractNote = {Apparatus and method for detecting, determining, and imaging surface resistance corrosion, thin film growth, and oxide formation on the surface of conductors or other electrical surface modification. The invention comprises a modified confocal resonator structure with the sample remote from the radiating mirror. Surface resistance is determined by analyzing and imaging reflected microwaves; imaging reveals anomalies due to surface impurities, non-stoichiometry, and the like, in the surface of the superconductor, conductor, dielectric, or semiconductor.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {1995},
month = {1}
}

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