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Title: Surface property detection apparatus and method

Apparatus and method for detecting, determining, and imaging surface resistance corrosion, thin film growth, and oxide formation on the surface of conductors or other electrical surface modification. The invention comprises a modified confocal resonator structure with the sample remote from the radiating mirror. Surface resistance is determined by analyzing and imaging reflected microwaves; imaging reveals anomalies due to surface impurities, non-stoichiometry, and the like, in the surface of the superconductor, conductor, dielectric, or semiconductor.
Inventors:
 [1];  [2];  [3];  [1]
  1. (Albuquerque, NM)
  2. (Evergreen, CO)
  3. (Placitas, NM)
Issue Date:
OSTI Identifier:
870017
Assignee:
Sandia Corporation (Albuquerque, NM) SNL
Patent Number(s):
US 5440238
Contract Number:
AC04-76DP00789
Research Org:
AT & T CORP
Country of Publication:
United States
Language:
English
Subject:
surface; property; detection; apparatus; method; detecting; determining; imaging; resistance; corrosion; film; growth; oxide; formation; conductors; electrical; modification; comprises; modified; confocal; resonator; structure; sample; remote; radiating; mirror; determined; analyzing; reflected; microwaves; reveals; anomalies; due; impurities; non-stoichiometry; superconductor; conductor; dielectric; semiconductor; surface resistance; detection apparatus; film growth; surface modification; resonator structure; surface impurities; imaging surface; sample remote; oxide form; reflected microwave; confocal resonator; /324/117/118/