Surface property detection apparatus and method
Abstract
Apparatus and method for detecting, determining, and imaging surface resistance corrosion, thin film growth, and oxide formation on the surface of conductors or other electrical surface modification. The invention comprises a modified confocal resonator structure with the sample remote from the radiating mirror. Surface resistance is determined by analyzing and imaging reflected microwaves; imaging reveals anomalies due to surface impurities, non-stoichiometry, and the like, in the surface of the superconductor, conductor, dielectric, or semiconductor.
- Inventors:
-
- Albuquerque, NM
- Evergreen, CO
- Placitas, NM
- Issue Date:
- Research Org.:
- AT&T
- OSTI Identifier:
- 870017
- Patent Number(s):
- 5440238
- Assignee:
- Sandia Corporation (Albuquerque, NM)
- Patent Classifications (CPCs):
-
G - PHYSICS G01 - MEASURING G01R - MEASURING ELECTRIC VARIABLES
Y - NEW / CROSS SECTIONAL TECHNOLOGIES Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC Y10T - TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- DOE Contract Number:
- AC04-76DP00789
- Resource Type:
- Patent
- Country of Publication:
- United States
- Language:
- English
- Subject:
- surface; property; detection; apparatus; method; detecting; determining; imaging; resistance; corrosion; film; growth; oxide; formation; conductors; electrical; modification; comprises; modified; confocal; resonator; structure; sample; remote; radiating; mirror; determined; analyzing; reflected; microwaves; reveals; anomalies; due; impurities; non-stoichiometry; superconductor; conductor; dielectric; semiconductor; surface resistance; detection apparatus; film growth; surface modification; resonator structure; surface impurities; imaging surface; sample remote; oxide form; reflected microwave; confocal resonator; /324/117/118/
Citation Formats
Martens, Jon S, Ginley, David S, Hietala, Vincent M, and Sorensen, Neil R. Surface property detection apparatus and method. United States: N. p., 1995.
Web.
Martens, Jon S, Ginley, David S, Hietala, Vincent M, & Sorensen, Neil R. Surface property detection apparatus and method. United States.
Martens, Jon S, Ginley, David S, Hietala, Vincent M, and Sorensen, Neil R. Sun .
"Surface property detection apparatus and method". United States. https://www.osti.gov/servlets/purl/870017.
@article{osti_870017,
title = {Surface property detection apparatus and method},
author = {Martens, Jon S and Ginley, David S and Hietala, Vincent M and Sorensen, Neil R},
abstractNote = {Apparatus and method for detecting, determining, and imaging surface resistance corrosion, thin film growth, and oxide formation on the surface of conductors or other electrical surface modification. The invention comprises a modified confocal resonator structure with the sample remote from the radiating mirror. Surface resistance is determined by analyzing and imaging reflected microwaves; imaging reveals anomalies due to surface impurities, non-stoichiometry, and the like, in the surface of the superconductor, conductor, dielectric, or semiconductor.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {Sun Jan 01 00:00:00 EST 1995},
month = {Sun Jan 01 00:00:00 EST 1995}
}
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